1982
DOI: 10.1016/0022-0248(82)90171-3
|View full text |Cite
|
Sign up to set email alerts
|

Heterogeneous kinetics and mass transfer in chemical vapour deposition processes

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3

Citation Types

1
14
0

Year Published

1983
1983
1996
1996

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 25 publications
(15 citation statements)
references
References 18 publications
1
14
0
Order By: Relevance
“…~s,i,lk i] ' i where Ks.i,1 = As.i.le E,.I,/T, [5] Values for the parameters n~, qi.~, A~.~.I, A~, E~.,.,, and Ea.~ in Eq. [1]- [5] can, in principle, be obtained by matching experimental and theoretical results.…”
Section: Model Descriptionmentioning
confidence: 99%
See 3 more Smart Citations
“…~s,i,lk i] ' i where Ks.i,1 = As.i.le E,.I,/T, [5] Values for the parameters n~, qi.~, A~.~.I, A~, E~.,.,, and Ea.~ in Eq. [1]- [5] can, in principle, be obtained by matching experimental and theoretical results.…”
Section: Model Descriptionmentioning
confidence: 99%
“…~s,i,lk i] ' i where Ks.i,1 = As.i.le E,.I,/T, [5] Values for the parameters n~, qi.~, A~.~.I, A~, E~.,.,, and Ea.~ in Eq. [1]- [5] can, in principle, be obtained by matching experimental and theoretical results. For a system with five gas phase species, two homogeneous reactions, and three heterogeneous reactions, this treatment would give 58 adjustable kinetic parameters.…”
Section: Model Descriptionmentioning
confidence: 99%
See 2 more Smart Citations
“…There is a dependency on concentration, however. Recent macroscopic scale modeling of a system similar to experiments I and II yielded that reduction of germanium doses to one-tenth the levels used in those two experiments sharply reduced the intensity of effects arising from the presence of substitutional germanium to the degree that normal variations in processing would mask their presence (10). The reduced germanium implant doses, on the order of 101~ Ge/cm 2, nominally correspond to levels used to preamorphize or postamorphize silicon.…”
mentioning
confidence: 97%