High contrast STEM imaging for light elements by an annular segmented detector

Ooe, Kousuke; Seki, Takahiko; Ikuhara, Yuichi; Shibata, Naoya

doi:10.1016/j.ultramic.2019.04.011

Cited by 18 publications

(4 citation statements)

References 28 publications

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“…The scattering factors of elements in electron diffraction are similar to those in XRD, i.e., directly related to the electron density. However, in transmission electron microscopy (TEM), selected area electron diffraction (SAED) under annular dark field (ADF) mode, such as the low-angle ADF (LAADF), high-angle annular dark field (HAADF), and annular bright field (ABF) modes, is in principle locally sensitive to light elements such as H, O, and Li. − …”

Section: Experimental Techniquesmentioning

confidence: 99%

Classical and Emerging Characterization Techniques for Investigation of Ion Transport Mechanisms in Crystalline Fast Ionic Conductors

et al. 2020

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Ion transport in crystalline fast ionic conductors is a complex physical phenomenon. Certain ionic species (e.g., Ag+, Cu+, Li+, F–, O2–, H+) in a solid crystalline framework can move as fast as in liquids. This property, although only observed in a limited number of materials, is a key enabler for a broad range of technologies, including batteries, fuel cells, and sensors. However, the mechanisms of ion transport in the crystal lattice of fast ionic conductors are still not fully understood despite the substantial progress achieved in the last 40 years, partly because of the wide range of length and time scales involved in the complex migration processes of ions in solids. Without a comprehensive understanding of these ion transport mechanisms, the rational design of new fast ionic conductors is not possible. In this review, we cover classical and emerging characterization techniques (both experimental and computational) that can be used to investigate ion transport processes in bulk crystalline inorganic materials which exhibit predominant ion conduction (i.e., negligible electronic conductivity) with a primary focus on literature published after 2000 and critically assess their strengths and limitations. Together with an overview of recent understanding, we highlight the need for a combined experimental and computational approach to study ion transport in solids of desired time and length scales and for precise measurements of physical parameters related to ion transport.

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Section: Experimental Techniquesmentioning

confidence: 99%

Classical and Emerging Characterization Techniques for Investigation of Ion Transport Mechanisms in Crystalline Fast Ionic Conductors

et al. 2020

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“…These improvements are based on configuring detector size/geometry and signal manipulations, representing specific examples of the STEM configured detectors discussed in the section “Configured detectors for versatile STEM imaging”. A recent example of such development is the use of annular segmented-detector configuration to enhance the image contrast of light elements by mathematical manipulation of different types of STEM images (Ooe et al, 2019).…”

Section: The Development Of Stem Imaging Theorymentioning

confidence: 99%

Advances and Applications of Atomic-Resolution Scanning Transmission Electron Microscopy

Liu

2021

Microsc Microanal

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Although scanning transmission electron microscopy (STEM) images of individual heavy atoms were reported 50 years ago, the applications of atomic-resolution STEM imaging became wide spread only after the practical realization of aberration correctors on field-emission STEM/TEM instruments to form sub-Ångstrom electron probes. The innovative designs and advances of electron optical systems, the fundamental understanding of electron–specimen interaction processes, and the advances in detector technology all played a major role in achieving the goal of atomic-resolution STEM imaging of practical materials. It is clear that tremendous advances in computer technology and electronics, image acquisition and processing algorithms, image simulations, and precision machining synergistically made atomic-resolution STEM imaging routinely accessible. It is anticipated that further hardware/software development is needed to achieve three-dimensional atomic-resolution STEM imaging with single-atom chemical sensitivity, even for electron-beam-sensitive materials. Artificial intelligence, machine learning, and big-data science are expected to significantly enhance the impact of STEM and associated techniques on many research fields such as materials science and engineering, quantum and nanoscale science, physics and chemistry, and biology and medicine. This review focuses on advances of STEM imaging from the invention of the field-emission electron gun to the realization of aberration-corrected and monochromated atomic-resolution STEM and its broad applications.

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“…With the recent developments of detector technology, new imaging modes of TEM are emerging. For example, four-dimensional STEM (4D-STEM) 12 uses a fast pixelated detector to acquire the diffraction pattern during STEM acquisition, and a variety of reconstruction methods, such as differential phase contrast (DPC) imaging 13 – 16 , optimized bright-field imaging 17 , 18 , integrated DPC imaging 19 – 22 and ptychography 23 – 26 , can be used to reconstruct the image. In contrast to ADF-STEM that preferentially selects electrons that scatter to a large angle by TDS, 4D-STEM can employ the interference between weakly scattered electrons, and thereby greatly increase the dose efficiency.…”

Section: Introductionmentioning

confidence: 99%

Direct observation of Cu in high-silica chabazite zeolite by electron ptychography using Wigner distribution deconvolution

Mitsuishi

Nakazawa

Sagawa

et al. 2023

Sci Rep

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Direct observation of Cu in Cu-chabazite (CHA) zeolite has been achieved by electron ptychography using the Wigner distribution deconvolution. The imaging properties of ptychographically reconstructed images were evaluated by comparing the intensities of six-membered-ring columns of the zeolite with and without Cu using simulated ptychography images. It was concluded that although false contrast may appear at Cu-free columns for some acquisition conditions, ptychography can discriminate columns with and without Cu. Experimental observation of CHA with and without Cu was performed. Images obtained from the Cu-containing sample showed contrast at the six-membered-rings, while no contrast was observed for the Cu-free sample. The results show that ptychography is a promising technique for visualizing the atomic structures of beam-sensitive materials.

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High contrast STEM imaging for light elements by an annular segmented detector

Cited by 18 publications

References 28 publications

Classical and Emerging Characterization Techniques for Investigation of Ion Transport Mechanisms in Crystalline Fast Ionic Conductors

Classical and Emerging Characterization Techniques for Investigation of Ion Transport Mechanisms in Crystalline Fast Ionic Conductors

Advances and Applications of Atomic-Resolution Scanning Transmission Electron Microscopy

Direct observation of Cu in high-silica chabazite zeolite by electron ptychography using Wigner distribution deconvolution

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