“…The initial NAD device was designed to perform also as a testing platform so we could explore various electrical interfaces between the semiconductor and the neuron using different electrode materials. Our first NAD device, called NAD Generation 0 or NAD0, is similar in construction to the initial Michigan probe that was created in 1970 [1,2,5,6,8,15,16]. NAD0 tested 3C-SiC as a base material, as there are still many defects which are the result of the SiC growth process, and we would like to explore the use of conductive 3C-SiC after characterizing the base material.…”