1992
DOI: 10.1016/0022-0248(92)90503-b
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High doping performance of lattice matched GaInP on GaAs

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Cited by 13 publications
(5 citation statements)
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“…In our laboratory, Si‐doped InGaP layers were grown on (100) GaAs substrates with growth parameters matching those of n‐InGaP NW shells (details in experimental section ), exhibiting a Hall mobility of 739 cm 2 V −1 s −1 at N D ≈ 4 · 10 18 cm −3 . These values correspond well with the previously published data for MOVPE‐grown n‐doped InGaP layers . A fit function through all data points is extracted to include the doping‐dependent mobilities to be used in our NW resistance model (see Figure S1 and Equation S3, Supporting Information).…”
Section: Resultssupporting
confidence: 81%
“…In our laboratory, Si‐doped InGaP layers were grown on (100) GaAs substrates with growth parameters matching those of n‐InGaP NW shells (details in experimental section ), exhibiting a Hall mobility of 739 cm 2 V −1 s −1 at N D ≈ 4 · 10 18 cm −3 . These values correspond well with the previously published data for MOVPE‐grown n‐doped InGaP layers . A fit function through all data points is extracted to include the doping‐dependent mobilities to be used in our NW resistance model (see Figure S1 and Equation S3, Supporting Information).…”
Section: Resultssupporting
confidence: 81%
“…A conduction band discontinuity of ΔEnormalC = 100 meV [ 35 ] and an emitter background doping of 5 × 10 15 cm −3 are assumed. [ 33 ] The SCR mostly extends into the InGaP due to the different doping of base and emitter. The total SCR width increases from dscr,I ≈ 51 nm in sample I to dscr,II ≈ 58 nm and dscr,III ≈ 68 nm for samples II and III.…”
Section: Resultsmentioning
confidence: 99%
“…[ 28,29 ] The n‐type background doping of the nid‐InGaP is assumed as ≤5 × 10 15 cm −3 , derived from planar nid‐InGaP layers. [ 33 ]…”
Section: Growth and Processingmentioning
confidence: 99%
“…Each Sub-cell is composed of a Ga 0.5 In 0.5 P window layer, a GaAs emitter and base, and an Al 0.8 Ga 0.2 As back surface field (BSF) layer. The parameters of Ga 0.5 In 0.5 P, GaAs, and Al 0.8 Ga 0.2 As materials are listed in Table 1 [25][26][27][28][29][30][31][32][33]. The effect of temperature on the material parameters was considered by using temperaturedependent physical models.…”
Section: Simulation Methodsmentioning
confidence: 99%
“…Material parameters (energy gap, carrier mobilities, radiative recombination rates and capture cross-sections) used in simulation[25][26][27][28][29][30][31][32][33].…”
mentioning
confidence: 99%