Ion Implantation and Beam Processing 1984
DOI: 10.1016/b978-0-12-756980-2.50012-6
|View full text |Cite
|
Sign up to set email alerts
|

High-Dose Implantation

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

1986
1986
1995
1995

Publication Types

Select...
3
2

Relationship

0
5

Authors

Journals

citations
Cited by 6 publications
(2 citation statements)
references
References 54 publications
0
2
0
Order By: Relevance
“…Freeman et al (1975) showed that the colour bands resulted from temperature variations produced across the wafer during implantation. Visible interference colours may be generated when there is either a surface layer of crystalline silicon above amorphous silicon or amorphous silicon above crystalline silicon, and the interface between these layers is sharp (Beanland 1977). The different colours arise from differences in the relative thicknesses of these amorphous-crystalline layers (Csepregi et a1 1976, Seidel el a1 1976).…”
Section: Structural Changesmentioning
confidence: 99%
See 1 more Smart Citation
“…Freeman et al (1975) showed that the colour bands resulted from temperature variations produced across the wafer during implantation. Visible interference colours may be generated when there is either a surface layer of crystalline silicon above amorphous silicon or amorphous silicon above crystalline silicon, and the interface between these layers is sharp (Beanland 1977). The different colours arise from differences in the relative thicknesses of these amorphous-crystalline layers (Csepregi et a1 1976, Seidel el a1 1976).…”
Section: Structural Changesmentioning
confidence: 99%
“…The different colours arise from differences in the relative thicknesses of these amorphous-crystalline layers (Csepregi et a1 1976, Seidel el a1 1976). Furthermore, the amorphous-crystalline layer thicknesses are very sensitive to the wafer temperature during implantation and changes of a few degrees (at average wafer temperatures of 100 "C or more, depending on the implanted species) can change a surface layer from totally amorphous to totally crystalline (Beanland 1977). the observed colour bands and their widths across a 5 cm diameter (1 11) silicon wafer uniformly scanned with a 500 PA, 40 keV phosphorus beam to a total dose of 2 x 1016cm-2.…”
Section: Structural Changesmentioning
confidence: 99%