2010
DOI: 10.1109/led.2010.2049190
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High-Efficiency c-Si Solar Cells Passivated With ALD and PECVD Aluminum Oxide

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Cited by 140 publications
(79 citation statements)
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“…As a result, we can obtain fixed charges on the AlO x /c-Si interface in 10 12 cm −2 . The CV curve shows right shifting, it reveals that the negative charges exist in AlO x , and induce an accumulation layer at the p-type silicon interface, resulting in a very effective field-effect passivation [21,22]. As shown in Figure 4, we compared two structures of the homojunction solar cells with and without AlO x passivation samples, both without ITO ARC-layers.…”
Section: Alo X Measurement and Analysismentioning
confidence: 99%
“…As a result, we can obtain fixed charges on the AlO x /c-Si interface in 10 12 cm −2 . The CV curve shows right shifting, it reveals that the negative charges exist in AlO x , and induce an accumulation layer at the p-type silicon interface, resulting in a very effective field-effect passivation [21,22]. As shown in Figure 4, we compared two structures of the homojunction solar cells with and without AlO x passivation samples, both without ITO ARC-layers.…”
Section: Alo X Measurement and Analysismentioning
confidence: 99%
“…After annealing Al 2 O 3 films at moderate temperatures, an outstanding S eff of <5 cm/s was obtained [49,53] on a low-resistive p-type wafer, and < 1 cm/s was obtained on an n-type c-Si wafer (1 Ω-cm to 4 Ω-cm). After the annealing process, the SiO 2 /Al 2 O 3 stack yields a high level of chemical passivation due to a low interface defect density [56]. Using the SiO 2 /Al 2 O 3 stack, an excellent efficiency of 21.5% has been obtained; furthermore, the Al 2 O 3 film overcomes the so-called "parasitic shunting" effects that are very common for SiN x -passivated rear passivation [45].…”
Section: Al 2 Omentioning
confidence: 99%
“…In the field of c-Si solar cells, the reduction of recombination losses at the surface of c-Si has become increasingly important in order to improve its power conversion efficiency [1][2][3]. In order to mitigate recombination losses at the surface of c-Si, many kinds of materials had been used [1][2][3][4].…”
Section: Introductionmentioning
confidence: 99%
“…In order to mitigate recombination losses at the surface of c-Si, many kinds of materials had been used [1][2][3][4]. In high-efficiency laboratory cells, traditionally, thermal SiO 2 grown in a high-temperature (≥ 900 o C) oxidation process have been applied as passivation layer with excellent chemical passivation property.…”
Section: Introductionmentioning
confidence: 99%
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