1995
DOI: 10.1109/23.488779
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High-energy heavy-ion-induced charge transport across multiple junctions

Abstract: High-energy heavy ion experiments and numerical simulations show that two or more junctions bridged by an ion track respond in a coupled manner. The potential difference across the structure strongly affects the amount of charge collected at each of the junctions. Experiments with 1.7 GeV 197Au ions indicate that, for emitter biases less than or equal to 0.0 volts and potential differences of 5 or more volts, more charge may be collected at a junction than was initialiy deposited by the ion. Simulations show t… Show more

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Cited by 8 publications
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“…There is increasing evidence [ 1,2] that LET alone is insufficient to fully define the SEE cross-sections for heavy ions in semi-conductor devices. Range, total-energy deposition or track structure are also important considerations.…”
Section: A Introductionmentioning
confidence: 99%
“…There is increasing evidence [ 1,2] that LET alone is insufficient to fully define the SEE cross-sections for heavy ions in semi-conductor devices. Range, total-energy deposition or track structure are also important considerations.…”
Section: A Introductionmentioning
confidence: 99%