In device simulation, f T is typically extracted at a single low frequency, e.g. 1 MHz, using g m /2πC. This is generally believed to give the same f T as traditional -20dB/decade slope extrapolation of |h 21 | at high frequencies. A large discrepancy between the two f T extraction methods is observed, and the degree of discrepancy is found to depend on BGN and temperature. We explain the discrepancy as a consequence of output NQS effect and develop a new f T equation including output NQS effect. The BGN model dependence can then be understood through ac current gain β ac . New methods of simulating f T are developed, which maintain the simplicity of g m /2πC extraction while giving the same results as -20dB/decade extrapolation.Index Terms-bandgap narrowing (BGN), device simulation, SiGe HBTs, physical modeling interface.