High-Frequency Characterization and Modeling of Coaxial Connectors With Degraded Contact Surfaces

Micro & Optical Tech Letters

Tian

et al. 2020

Self Cite

High-speed connectors are widely used in digital differential circuits. Because of the uneven gold plating, the thin gold plating area on the contact surface of the connector will form corrosion films in extreme environment, which may not only deteriorate the reflection and transmission performance of electromagnetic wave in differential circuits but also affects its symmetry, which results in poor communication quality. In this work, considering the influence of differential circuit symmetry on the signal transmission, reflection and crosstalk, the d parameter was defined for measuring the circuit symmetry. The impact of high-speed connector degradation on symmetry of differential circuits was studied by both experimental investigation and electromagnetic numerical calculation model analysis. These results are helpful in developing a better understanding of impact of connector degradation on symmetry of high-speed differential circuits and in identifying failure features in fault diagnosis.

Section: Introductionmentioning

confidence: 99%

Symmetry degradation of differential circuits induced by uneven gold plating of high‐speed connectors in extreme environment

Wang

Micro & Optical Tech Letters

Tian

et al. 2020

Self Cite

“…They studied the trending of resistance changes when the connector is subjected to random vibration and analyzed the impact of vibration amplitude and frequency on resistance. Ji et al considered DC resistance, impedance characteristics, and high‐frequency behavior. Israel et al studied the influences of the peak current on the thermal stress for a model contact system during short circuits.…”

Section: Introductionmentioning

confidence: 99%

Analysis of electromagnetic behaviors induced by contact failure in electrical connectors

Micro & Optical Tech Letters

Flowers

2019

Self Cite

Electrical connectors are widely used in electrical devices as an interconnect element and their reliability is a critical factor in device performance. However, there are multiple factors that may lead to poor reliability. These include contact failure induced by temperature and humidity, vibration, and atmospheric contamination, which may induce deterioration of the transmitted signal and leakage of electromagnetic energy. In the current work, the contact failure characteristics of a specific connector are investigated through measurement and analysis of high frequency parameters and spectrums. Based on transmission line theory and electrical contact theory, an equivalent model was developed to explore the effect of contact failure on high frequency parameters. Experiments were conducted using a network analyzer, signal generator, signal analyzer, and H‐field probe. The high frequency parameters were measured and compared with the calculated values, with consistent results. The leakage spectrums were measured with an H‐field probe for a variety of input signal amplitudes and frequencies and loose contact conditions. The results indicate that leakage increases with higher frequency and greater input signal amplitude.

“…Flowers et al explored the mechanism of fretting corrosion, and analyzed the contact degradation properties considering the contact resistance and high‐frequency parameters. Ji et al developed an equivalent impedance model to study the effect of different degradation levels under oxidation environment for the coaxial connectors at high frequency. Jin et al studied the power dependence of PIM features and analyzed the influence of the contact surface degradation on connector performance.…”

Section: Introductionmentioning

confidence: 99%

The effect of contact degradation on electromagnetic radiation in electronic devices

Int J RF Microw Comput Aided Eng

Flowers

2019

Self Cite

Loose electrical connectors tend to increase electromagnetic radiation. In this current study, the effect of loose contacts on electromagnetic radiation is theoretically modeled and experimentally analyzed. An equivalent model was developed and a wire antenna model was built according to the physical dimensions of the connector to evaluate the radiated field in the time domain.Combining the expressions of the radiated fields and the transfer function of the test probe, the relationship between the input signal and the leakage voltage was obtained. The near field test method was used to measure the leakage signal caused by the loose contact. The tested results for a specific loose contact condition were consistent with the theoretical analysis. K E Y W O R D Scontact degradation, electromagnetic radiation, wire antenna model