1997 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium. Digest of Technical Papers
DOI: 10.1109/rfic.1997.598751
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High frequency interconnects on silicon substrates

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Cited by 27 publications
(13 citation statements)
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“…The given SiGe process has a silicon substrate that is quite conductive (p = 20 Q-cm) and hence dielectric loss is a major concern. There are two potential choices that are widely used for integrated circuit design: microstrip (MS) and coplanar waveguide (CPW) [7]. In case of lossy substrate, thin-film microstrip (TFMS) are usually used [7].…”
Section: Coplanar Transmission Line and Designmentioning
confidence: 99%
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“…The given SiGe process has a silicon substrate that is quite conductive (p = 20 Q-cm) and hence dielectric loss is a major concern. There are two potential choices that are widely used for integrated circuit design: microstrip (MS) and coplanar waveguide (CPW) [7]. In case of lossy substrate, thin-film microstrip (TFMS) are usually used [7].…”
Section: Coplanar Transmission Line and Designmentioning
confidence: 99%
“…There are two potential choices that are widely used for integrated circuit design: microstrip (MS) and coplanar waveguide (CPW) [7]. In case of lossy substrate, thin-film microstrip (TFMS) are usually used [7]. However, TFMS has significantly less distance between the top conductor plane and the ground plane.…”
Section: Coplanar Transmission Line and Designmentioning
confidence: 99%
“…Such applications include fabrication of high-Q filters, resonators, and corporate feed of antenna arrays. This issue is especially important at submillimeter wave region as the dimensions have to be physically small, skin depth is very small, and dielectric loss tangent of the substrate becomes high [1][2][3][4][5][6][7].…”
Section: Introductionmentioning
confidence: 99%
“…Here, the bulk silicon material is removed underneath the patch radiator to synthesize a locally low-dielectric constant (ε r ~ 1) region around the antenna, as shown in Figure 1a. The second problem is overcome by using a high-resistivity silicon (HRS) substrate [3], where the losses due to the substrate…”
Section: Introductionmentioning
confidence: 99%