The dependence of UV‐LED lifetime on threading dislocation density(TDD) was examined. UV‐LED structures were grown on standard GaN template(TDD: 1x108/cm2) and ELO‐GaN(TDD: 1x107/cm2), and lifetime testing was performed under a forward current of 500 mA at junction temperature(Tj) of 75 ºC. Lifetime of both LEDs were estimated as 17,600 h (standard GaN template) and 166,000 h (ELO‐GaN), respectively. It was found that GaN underlying layer with TD‐density of 1x107/cm2 is superior to that of 1x108/cm2 in terms of LED lifetime, despite no output power difference. Junction temperature (Tj) dependence of LED lifetime was investigated in use of standard GaN template(1x108/cm2). Tj was varied from 311 K to 422 K. The activation energy was determined to be 0.36 eV. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)