2017
DOI: 10.1002/aelm.201700128
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High‐Performance Bottom‐Contact Organic Thin‐Film Transistors by Improving the Lateral Contact

Abstract: prepatterned electrodes on the substrates generate artificial steps that significantly affect the morphological uniformity and continuity of the organic active layer at the electrode/organic interfaces, causing large contact resistance. The most common solution is to modify the electrodes, e.g., chemical bonding of thiols on gold, inserting buffer layer on the electrodes, or applying conductive materials such as graphene, polypyrrole as electrodes. [2,10, These approaches could either realize a good energy lev… Show more

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Cited by 13 publications
(8 citation statements)
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“…[22][23][24][25] Several methods have been proposed to reduce the contact resistance and improve charge injection at metal/organic interface, such as contact doping, introducing a charge injection layer, or forming an abrupt damage-free metal/semiconductor interface by transferred electrodes. [2,5,[24][25][26][27][28][29][30] However, these methods require additional and complicated processes, which increase the difficulty of device fabrication and some of them also…”
Section: Introductionmentioning
confidence: 99%
“…[22][23][24][25] Several methods have been proposed to reduce the contact resistance and improve charge injection at metal/organic interface, such as contact doping, introducing a charge injection layer, or forming an abrupt damage-free metal/semiconductor interface by transferred electrodes. [2,5,[24][25][26][27][28][29][30] However, these methods require additional and complicated processes, which increase the difficulty of device fabrication and some of them also…”
Section: Introductionmentioning
confidence: 99%
“…The difference of surface energy is not the reason that why the pentacene films have different morphology. The possible reason is that the PT on Ag electrode leads to smoother surface, and the π–π stacking between PT and pentacene induces the 2D layer by layer growth . It is worth mentioning that the contact angle of modified Ag is much larger than that of the Ag 2 O, which demonstrates that the improvement of performance in the experiment is not the effect of the oxidation of Ag electrodes …”
Section: Resultsmentioning
confidence: 90%
“…To overcome the high contact resistance in bottom contact OFETs, we applied a setting of V D = À100 V and V GS = 20 V to À100 V for the electrical characterizations. [41][42][43] Typically, contact resistance of an OFET is obtained through the transmission line model (TLM) method with the hypothesis that a series of devices have the same carrier transport properties in the channels. 44 Here a G-function method, an easy and rapid analytical approach with no assumptions regarding materials or device structures, was conducted for calculating the contact resistance by measuring output characteristics of an individual OFET.…”
Section: Resultsmentioning
confidence: 99%
“…To overcome the high contact resistance in bottom contact OFETs, we applied a setting of V D = −100 V and V GS = 20 V to −100 V for the electrical characterizations. 41–43…”
Section: Resultsmentioning
confidence: 99%