2016
DOI: 10.1109/led.2016.2545692
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High-Performance, Solution-Processed Indium-Oxide TFTs Using Rapid Flash Lamp Annealing

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Cited by 32 publications
(29 citation statements)
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“…However, this dramatic temperature reduction has not been accompanied by a corresponding reduction in film-processing time, which remains far greater (presently 1-2 h minimum) than acceptable for efficient, continuous additive manufacture, as in typical FAB lines. A noticeable exception is capital-intensive flash lamp annealing (FLA) for millisecond fabrication of silicon shallow junctions, which has recently been adapted to MO film growth (30)(31)(32). However, the high energy-density radiation pulses instantly generate temperatures >1,000°C at the film surface with very large temperature gradients downward.…”
mentioning
confidence: 99%
“…However, this dramatic temperature reduction has not been accompanied by a corresponding reduction in film-processing time, which remains far greater (presently 1-2 h minimum) than acceptable for efficient, continuous additive manufacture, as in typical FAB lines. A noticeable exception is capital-intensive flash lamp annealing (FLA) for millisecond fabrication of silicon shallow junctions, which has recently been adapted to MO film growth (30)(31)(32). However, the high energy-density radiation pulses instantly generate temperatures >1,000°C at the film surface with very large temperature gradients downward.…”
mentioning
confidence: 99%
“…Since the conventional temperature measurement devices, such as thermocouples, rely on physical contact with the sample, measurement of temperature under FLA represent a significant challenge due to the short timescales involved during flashing. In order to eliminate this issue, optical‐based measurement techniques have been suggested . Alternatively, simulation‐based techniques can also be utilized to estimate the temperature range on the sample surface …”
Section: Flash Lamp Annealingmentioning
confidence: 99%
“…Kang et al used a surface thermometer and a 1D heat transfer model in order to estimate the temperatures during the FLA treatment . According to their simulation, the surface of the Si/SiO 2 substrate reached temperatures above 350 °C after the flash lamp irradiation with flashes featuring radiant energies of 207 J per pulse at a total irradiation time of 120 s with a fire rate of 15 Hz.…”
Section: Flash Lamp Annealingmentioning
confidence: 99%
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“…Over the past few years, metal oxide semiconductors have attracted much attention because of their high charge carrier mobility, high optical transparency in the visible region, wide band gap, etc. [ 1 , 2 , 3 , 4 , 5 , 6 ]. Therefore, metal oxide thin film transistors (TFT) have wide application prospects in the next generation displays, such as transparent displays, 3-dimensional (3D) displays, and active-matrix organic light emitting diode displays (AMOLEDs) [ 3 , 4 , 5 , 6 , 7 , 8 ].…”
Section: Introductionmentioning
confidence: 99%