In this letter, we propose a novel SiGe channel heterostructure dynamic threshold metal oxide semiconductor (DTMOS) and demonstrate its superiority over conventional Si-DTMOS. The introduction of a SiGe layer for the channel is very effective for reducing the threshold voltage in spite of keeping impurity doping level at the body region. Therefore, a low threshold voltage and a large body effect factor can be achieved simultaneously. The SiGe HDTMOS with highly doped body exhibits 2 times higher transconductance, 1.4 times higher saturation current, and better short channel immunity than that of the control Si-DTMOS with lightly doped body of which threshold voltage is nearly the same.Index Terms-, body effect factor, DTMOS, parasitic channel, short channel effect, SiGe.