Extended Abstracts of the 1999 International Conference on Solid State Devices and Materials 1999
DOI: 10.7567/ssdm.1999.le-2-1
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High Performance Sub-0.1 μm Dynamic Threshold MOSFET Using Indium Channel Implantation

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“…Such a retrograde channel profile is the useful way to enhance with maintaining low . In fact, an enhanced drain current owing to large was realized in the Si DTMOS with super-steep-retrograde indium-channel profile [4]. After epitaxial growth and isolation processes, wet thermal oxidation of the Si cap layer at 750 C was carried out to form 8 nm-thick gate oxide.…”
Section: Methodsmentioning
confidence: 99%
“…Such a retrograde channel profile is the useful way to enhance with maintaining low . In fact, an enhanced drain current owing to large was realized in the Si DTMOS with super-steep-retrograde indium-channel profile [4]. After epitaxial growth and isolation processes, wet thermal oxidation of the Si cap layer at 750 C was carried out to form 8 nm-thick gate oxide.…”
Section: Methodsmentioning
confidence: 99%
“…Since the device exhibits the same normal-mode V TH under the off state (because V G = V BS = 0), low standby power consumption is maintained. The subthreshold slope and short channel effects are also improved due to the dynamics substrate bias [1][2][3]. However, the pn diode between the substrate and the source turns on as the forward bias between the substrate and the source terminals becomes larger than 0.7 V. A considerably large leakage current due to the turn-on diode current between substrate and source terminals was a serious issue under DT mode operation, as shown in Fig.…”
Section: Introductionmentioning
confidence: 97%