2004
DOI: 10.1023/b:ints.0000028660.10853.c6
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High-Resolution Electron Microscopy of Interfaces between Solids with Varying Degree of Atomic Ordering

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Cited by 3 publications
(1 citation statement)
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“…In et al [13,51,14], Plikat [22,52], Thiel [21,53] Eintrittsäche der j-ten Scheibe erhält: P (j) (x, y) = exp(iσϕ (j) (x, y))…”
Section: Analytische Transmissionselektronenmikroskopieunclassified
“…In et al [13,51,14], Plikat [22,52], Thiel [21,53] Eintrittsäche der j-ten Scheibe erhält: P (j) (x, y) = exp(iσϕ (j) (x, y))…”
Section: Analytische Transmissionselektronenmikroskopieunclassified