High Resolution X-Ray Computed Tomography for Composites and Electronics Inspection

Cueman, M. Kent; Thomas, Lewis J.; Trzaskos, Casmir; Greskovich, C.

doi:10.1007/978-1-4613-0817-1_55

Review of Progress in Quantitative Nondestructive Evaluation 1989

DOI: 10.1007/978-1-4613-0817-1_55

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High Resolution X-Ray Computed Tomography for Composites and Electronics Inspection

M. Kent Cueman¹,

Lewis J. Thomas²,

Casmir Trzaskos³

et al.

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1990

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Nondestructive investigation of damage in composites using x-ray tomographic microscopy (XTM)

et al. 1990

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X-ray tomographic microscopy (XTM), utilizing intense, highly collimated synchrotron radiation, has been used to nondestructively image materials structures in three dimensions. The spatial resolution of the technique approaches that of conventional optical microscopy, but XTM does not require polished surfaces or serial sections. We present the results of an XTM investigation of a composite material composed of silicon-carbide fibers in an aluminum matrix. The results reveal the aluminum/silicon-carbide interfaces and show microcracks running along many of the interfaces as well as in the matrix. Excellent contrast is observed between the silicon-carbide sheath of the fiber surrounding the graphite core and the coating at the fiber-matrix interface. The sensitivity to small changes in the linear absorption coefficient allows nondestructive imaging of variations in chemistry between graphite and silicon carbide and between silicon carbide and aluminum. The experimentally determined values of the absorption coefficients of these phases are identical to values published in the literature. For the first time, XTM will allow observation of damage accumulation and crack growth during deformation testing. The availability of such data will greatly improve our understanding of failure in advanced materials.

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Nondestructive investigation of damage in composites using x-ray tomographic microscopy (XTM)

et al. 1990

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Nondestructive Imaging of Materials Microstructures Using X-Ray Tomographic Microscopy

et al. 1990

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A technique for nondestructively imaging microstructures of materials in situ, especially a technique capable of delineating the time evolution of chemical changes or damage, will greatly benefit studies of materials processing and failure. X-ray tomographic microscopy (XTM) is a high resolution, three-dimensional inspection method which is capable of imaging composite materials microstructures with a resolution of a few micrometers. Because XTM is nondestructive, it will be possible to examine materials under load or during processing, and obtain three-dimensional images of fiber positions, microcracks, and pores. This will allow direct imaging of microstructural evolution, and will provide time-dependent data for comparison to fracture mechanics and processing models.

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High Resolution X-Ray Computed Tomography for Composites and Electronics Inspection

Cited by 2 publications

References 2 publications

Nondestructive investigation of damage in composites using x-ray tomographic microscopy (XTM)

Nondestructive investigation of damage in composites using x-ray tomographic microscopy (XTM)

Nondestructive Imaging of Materials Microstructures Using X-Ray Tomographic Microscopy

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