High resolution X-ray sensor for non-destructive evaluation

Nagarkar, Vivek V.; Gordon, J.; Vasile, Stefan; Gothoskar, Prakash; Hopkins, Forrest

doi:10.1109/23.507103

Cited by 47 publications

(17 citation statements)

References 4 publications

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“…It results from the fact that columnar structure decreases the lateral spreading of scintillating light and guides scintillating light into the photo sensor through multiple reflections at column surfaces. Although various researches and approaches in columnar CsI(Tl) screens were conducted in medical [3], [4] and industrial [5], [6] applications, better performance is still required. Manuscript To well-couple with pixelated photo sensors, CsI(Tl) film was also fabricated into the pixelated structure.…”

Section: Introductionmentioning

confidence: 99%

Fabrication and Performance of CsI(Tl) Scintillation Films With Pixel-Like Columnar-Matrix Structure

Yao

Liu

et al. 2015

IEEE Trans. Nucl. Sci.

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In the recent decade, pixelated CsI(Tl) scintillation films are developed for X-ray imaging to improve spatial resolution. Several methods have been reported but better performance is still required. In this work, CsI(Tl) films were prepared on specially designed patterned substrates with regular arrays of pits. Each CsI(Tl) micro-column locates in one pit. In this way, CsI(Tl) films with pixel-like columnar-matrix structure were achieved. Each pixel contains one micro-column and the size of pixel is the average diameter of the columns. Morphologies of the films were examined by scanning electron microscopy. Imaging performances of films dependent on their structure are discussed. The prepared CsI(Tl) films show superior image performance and may be well-coupled with pixelated photo sensors for X-ray imaging systems.

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Section: Introductionmentioning

confidence: 99%

Fabrication and Performance of CsI(Tl) Scintillation Films With Pixel-Like Columnar-Matrix Structure

Yao

Liu

et al. 2015

IEEE Trans. Nucl. Sci.

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“…Hence the number of suitable inspection techniques is also on the rise. A few of the most commonly used methods in NDT: Visual and Optical Testing [2], Radiography [3], Ultrasonic, Leak, Liquid Penetrant, Acoustic Emission, Electromagnetic [4; 5]. There are several methods such as eddy current inspection [6], remote field testing, flux leakage and Barkhausen noise that use the electromagnetism as the principle of operation.…”

Section: Introductionmentioning

confidence: 99%

Planar Electromagnetic Sensors: Characterization, Applications and Experimental Results (Planare elektromagnetische Sensoren: Charakterisierung, Anwendungen und experimentelle Ergebnisse)

Mukhopadhyay¹

2007

Tm - Technisches Messen

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Inspection and evaluation of conducting, magnetic and dielectric properties of materials without destroying them is very useful in industries. This paper has reported planar electromagnetic sensors, (i) meander, (ii) mesh and (iii) interdigital configuration for nondestructive applications. The characterization of three types of planar sensors has been studied and comparative performance has been evaluated based on their areas of applications and results are presented here.

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“…In recent years, digital X-ray imaging detectors have been developed for industrial applications [1][2] and medical radiography [3]. In many indirect imaging detectors, the scintillation film is an essential component whose properties would greatly influence the detector performance.…”

Section: Introductionmentioning

confidence: 99%

A high spatial resolution CsI:Tl scintillation film based on net-like substrate

Zhang

Yao

et al. 2010

Seventh International Conference on Thin Film Physics and Applications

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CsI:Tl scintillation films were prepared on the net-like patterning substrates. The pattern of the substrates as well as the morphology of the CsI:Tl films were measured by SEM. The results show that the size of each grid on substrate is 55μm which is formed by SU-8 photoresist with 5μm in both height and width, and the CsI:Tl films display quite a good columnar structure. The spatial resolutions of X-ray imaging were taken by MTF measurement. The spatial frequency of the CsI:Tl films on patterned substrates can reach up to 10 lp/mm at the 10% level of MTF, which is twice higher than that of the CsI:Tl film on the substrate without patterning.

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High resolution X-ray sensor for non-destructive evaluation

Cited by 47 publications

References 4 publications

Fabrication and Performance of CsI(Tl) Scintillation Films With Pixel-Like Columnar-Matrix Structure

Fabrication and Performance of CsI(Tl) Scintillation Films With Pixel-Like Columnar-Matrix Structure

Planar Electromagnetic Sensors: Characterization, Applications and Experimental Results (Planare elektromagnetische Sensoren: Charakterisierung, Anwendungen und experimentelle Ergebnisse)

A high spatial resolution CsI:Tl scintillation film based on net-like substrate

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