High-resolution XRD study of stress-modulated YBCO films with various thicknesses

Xiong, Jie; Qin, Wenfeng; Cui, Xumei; Tao, Bowan; Tang, Junlei; Li, Yanrong

doi:10.1016/j.jcrysgro.2006.11.335

Cited by 30 publications

(10 citation statements)

References 11 publications

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“…For other SCO films after oxygen/vacuum annealing, we found the same feature in their ϕ-scan patterns, which means that the single in-plane orientation and side-by-side model between the film and substrate remain unchanged in the SCO/LAO film during long-time air exposure or annealing process. According to the literature [24,25], in-plane lattice parameters for epitaxial films, especially for thin films, are usually consistent with that of underlying substrate in order to reduce interface energy. So we consider that in-plane lattice parameters of the epitaxial SCO/LAO films are close to that of the substrate (3.792 Å) and change little during the subsequent air exposure/annealing process.…”

Section: Structural Characterization Magnetic and Electrical Propertmentioning

confidence: 99%

Preparation of SrCoOx thin films on LaAlO3 substrate and their reversible redox process at moderate temperatures

Lin

Zhang

Xie

et al. 2015

Journal of Crystal Growth

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Section: Structural Characterization Magnetic and Electrical Propertmentioning

confidence: 99%

Preparation of SrCoOx thin films on LaAlO3 substrate and their reversible redox process at moderate temperatures

Lin

Zhang

Xie

et al. 2015

Journal of Crystal Growth

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“…These luminescent lines in ruby originate from the presence of Cr 3+ ions in the host α-Al 2 O 3 structure. Here, the electron configuration of Cr 3+ ([Ar]3d 3 ) allows electronic transitions across the 2 E excited state and 4 A 2 ground state. The lifetime of the 2 E states is short; therefore, the electrons are transferred to a metastable E̅ and 2A̅ state.…”

Section: ■ Results and Discussionmentioning

confidence: 99%

“…Thin films are vital components in the design and functionality of advanced devices in the fields of microelectronics, photovoltaics, biomedical devices, etc. However, the performance of the thin films can be compromised by the buildup of residual stress. − Therefore, it is critical to find a simple and reliable way to measure the residual stress in thin films. A common method to assess the stress evolution in materials consists of measuring specific changes in their physical properties, such as optical characteristics that are influenced by buildup stress .…”

Section: Introductionmentioning

confidence: 99%

Accurate Ruby Sensor for Stress Analysis in Electronics

Yang

Cortés-Vega

Ahmadi

et al. 2022

ACS Appl. Electron. Mater.

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In this work, we present a simple and cost-effective method to produce a stress sensor based on the luminescence response of ruby thin films. The proposed sensor has a multilayer configuration between the target film of YBa2Cu3O7‑δ (YBCO), the nickel tape substrate, and a ruby thin film, among others. The ruby film is deposited by sputtering, and the YBCO was deposited by A-MOCVD on the opposite surface on the top of the Ni-tape substrate. The performance of the sensor is estimated by calculating the residual stresses of the YBCO thin film after deposition. The analysis is conducted using Raman spectroscopy, where the shift of the luminescent lines of ruby are used to determine the residual stress built up, which is extrapolated by means of the Stoney equation to the REBCO film. The calculated residual stress in the ruby sensor is from 0.56 to 0.625 GPa, which translates to 1.50–1.68 GPa in the REBCO film. Further confirmation of the residual stress value in the REBCO film is done using the Stoney equation, resulting in a stress value of 1.55 GPa. This demonstrates the accuracy of the method. The sensitivity, easy processing, reliability, and low cost of the ruby thin films make of them a highly desirable option for their application as stress sensors for a wide variety of applications, including electronics.

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“…In the studies, it was seen that MgO, SrTiO 3 , LaAlO 3 , Al 2 O 3 and yttria stabilised zirconia substrates appear to be suitable substrate materials on which BiSrCaCuO superconducting thin films are successfully grown. 26,27 In the present study, the properties of the (BiPb) 2 Sr 2 Ca 2 Cu 3 O 10zy thin films deposited on the MgO (100) substrate by rf sputtering were investigated as a function of the Bi content. The effect of the Bi deficiency on the structural, electrical, magnetic and critical current density is reported.…”

Section: Introductionmentioning

confidence: 99%

Effect of Bi deficiency on grain alignment of BiPb-2223 thin film fabricated using rf sputtering process and on critical current density properties

Aksan

Altın

Yakıncı

et al. 2011

Materials Science and Technology

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In the present study, thin films prepared as a function of the Bi concentration in the BiPbSrCaCuO system were synthesised. Thin films were fabricated using radio frequency sputtering method. Crystal structure of the films fabricated was determined from X-ray diffraction measurements. The crystal orientation was analysed by X-ray pole figure and in-plane alignment. Both X-ray diffraction and pole figure analysis revealed that crystallinity in the films decreased significantly with decreasing Bi concentration in the system. A systematic decrease in the superconducting transition temperature and hole concentration per CuO plane was obtained with decreasing Bi concentration. The Jc values of the films were calculated using Bean formula. It exhibits a significant dependence on the magnetic field and temperature. It was found that Jc decreased sharply with increasing applied magnetic field. The highest Jc value was found to be 1·06×106 A cm−2 at 10 K, which corresponded to the best flux pinning among the films fabricated.

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High-resolution XRD study of stress-modulated YBCO films with various thicknesses

Cited by 30 publications

References 11 publications

Preparation of SrCoOx thin films on LaAlO3 substrate and their reversible redox process at moderate temperatures

Preparation of SrCoOx thin films on LaAlO3 substrate and their reversible redox process at moderate temperatures

Accurate Ruby Sensor for Stress Analysis in Electronics

Effect of Bi deficiency on grain alignment of BiPb-2223 thin film fabricated using rf sputtering process and on critical current density properties

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