High-sensitive and broad-dynamic-range quantitative phase imaging with spectral domain phase microscopy

Abstract

Spectral domain phase microscopy for high-sensitive and broad-dynamic-range quantitative phase imaging is presented. The phase retrieval is realized in the depth domain to maintain a high sensitivity, while the phase information obtained in the spectral domain is exploited to extend the dynamic range of optical path difference. Sensitivity advantage of phase retrieved in the depth domain over that in the spectral domain is thoroughly investigated. The performance of the proposed depth domain phase based approach is illustrated by phase imaging of a resolution target and an onion skin.

Amplified phase measurement of thin-film thickness by swept-source spectral interferometry

“…Nevertheless, at least three times of recirculation are realized, which can be fully exploited for sensitivity enhancement of phase measurement. However, the degradation of spectral power after each recirculation offers negative contribution to enhancement of sensitivity in phase measurement [12,13]. As an empirical rule, the effect spectral range is confined in Eq.…”