1999
DOI: 10.1016/s0921-5107(98)00365-1
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High speed growth of device quality GaN and InGaN by RF-MBE

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Cited by 24 publications
(14 citation statements)
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“…With increasing nitrogen flow rate, the diffraction peak position of InGaN (0 0 0 2) shifted from that of GaN to InN (0 0 0 2), that is, indium content increased from $1% to 22%. This result is in agreement with results of the change of the indium content by a change of RF-power, reported by Kushi et al [9].…”
Section: Methodssupporting
confidence: 93%
See 1 more Smart Citation
“…With increasing nitrogen flow rate, the diffraction peak position of InGaN (0 0 0 2) shifted from that of GaN to InN (0 0 0 2), that is, indium content increased from $1% to 22%. This result is in agreement with results of the change of the indium content by a change of RF-power, reported by Kushi et al [9].…”
Section: Methodssupporting
confidence: 93%
“…To obtain the entire alloy composition of InGaN, generally growth conditions such as growth temperature [1,9,10] or In/Ga supply ratio [9][10][11] reports of the growth of InGaN, in which the nitrogen supply rate was intentionally changed, were still few. Therefore, relationship between N/III supply ratio and the properties of InGaN, such as the surface morphology, the resulting alloy composition and optical properties, are not understood well.…”
Section: Introductionmentioning
confidence: 99%
“…No apparent quantum confinement effect was observed since the nanoparticles reported here had a mean size of 6.4 nm, which was relatively large considering that the Bohr radius of GaN is approximately 3 nm. [17] Differing from the thin film materials, [18] longer wavelength emis- sion was also observed, indicating collateral emission from surface defects or from a deep trap. [19] To summarize this study, we confirm the unique fact that highly pure, monodisperse, and ultrafine GaN nanoparticles can be produced by means of MOCVD.…”
mentioning
confidence: 99%
“…The large lattice mismatch may induce lattice strain [6] and contribute to a potential solid-phase miscibility gap in the ternary In 1-x Ga x N alloy system [7]. These factors may be a cause of the reported compositional inhomogeneity observed in In 1-x Ga x N epilayers [8][9][10][11][12], which reduces the device efficiencies of In 1-x Ga x N based optoelectronic structures. However, high pressure chemical vapor deposition has been found to be an effective technique to improve the phase stability in In 1-x Ga x N epilayers [13].…”
Section: Introductionmentioning
confidence: 99%