“…[24] Along with the great progress of the computer digital-image processing technology, the point-to-point resolution recognition technology of the super microscope technology has also made a breakthrough improvement. [25][26][27] The images of high-resolution transmission electron microcopy (HRTEM) at nanoscale make it possible to accurately process local elastic strain images, [27] which are also used to characterize the elastic strain field images of the lattice distortions of the grain boundaries, dislocations, interfaces of nano-microelectronic devices, and hetero-junction interface structures. [24,28,29] In addition, there are some postprocessing methods based on atomic coordinates, such as calculating the atomic-level elastic strain tensors in crystalline systems on the elastic-plastic decomposition of crystal deformation, [30] calculating local strain tensors based on the relative motion of neighboring particles [31,32] and using the polyhedral template matching method to calculate strain.…”