2015
DOI: 10.1016/j.jmmm.2014.09.028
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High-temperature ferromagnetism of Si 1−x Mn x ( x ≈0.52−0.55) alloys

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Cited by 4 publications
(8 citation statements)
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“…13 The substrate temperature during the deposition (340 • C) was the same as for previous DG deposited films, while the deposition rate was higher (≥ 7 nm/min). The Rutherford backscattering spectrometry (RBS) was used to determine the film composition and thickness.…”
Section: Samples and Experimental Detailsmentioning
confidence: 99%
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“…13 The substrate temperature during the deposition (340 • C) was the same as for previous DG deposited films, while the deposition rate was higher (≥ 7 nm/min). The Rutherford backscattering spectrometry (RBS) was used to determine the film composition and thickness.…”
Section: Samples and Experimental Detailsmentioning
confidence: 99%
“…The Rutherford backscattering spectrometry (RBS) was used to determine the film composition and thickness. 13 The film thickness d depends on the distance L to the target; the value d decreases from 270 to 70 nm with the increase of L at the length δL≈15 mm. The Mn content at the same deposited area increases from 0.506 up to 0.517.…”
Section: Samples and Experimental Detailsmentioning
confidence: 99%
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