2024
DOI: 10.1007/s10854-024-12007-7
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High-temperature sensitivity complex dielectric/electric modulus, loss tangent, and AC conductivity in Au/(S:DLC)/p-Si (MIS) structures

A. Tataroglu,
H. Durmuş,
A. Feizollahi Vahid
et al.

Abstract: Complex dielectric (ε* = ε′ − jε″)/electric modulus (M* = M′ + jM″), loss tangent (tanδ), and ac conductivity (σac) properties of Au/(S-DLC)/p-Si structures were investigated by utilizing admittance/impedance measurements between 80 and 440 K at 0.1 and 0.5 MHz. Sulfur-doped diamond-like carbon (S:DLC) was used an interlayer at Au/p-Si interface utilizing electrodeposition method. The capacitance/conductance (C/G) or (ε' ~ C) and (ε″ ~ G) values found to be highly dependent on both frequency and temperature. T… Show more

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