We report an in situ method of preparing tips for scanning probe microscopy (SPM). Oriented singlecrystal nickel oxide (NiO) rods were diced, using a wafer saw, to prepare artificial breaking points. Two geometries, a single rod and a two-sided cut rod were fabricated. The cleavable tips were mounted to a force sensor based on a quartz tuning fork and cleaved using the coarse approach of the SPM. Atomically resolved force microscopy images of NiO (001) The resolution of scanning probe microscopy (SPM) and the SPM's feedback characteristics depend strongly on the physical nature of the tip and sample.1 Recent experiments with well-prepared tips allow the measurement of forces which are necessary to move atoms 2, 3 and the imaging of the structure of pentacene with unprecedented spatial resolution.
4The atomic configuration and chemical identity of the tip is a key to the distance and angular dependence of tip-sample interactions. However, these preparation methods require a conductive tip. For nonconductive tip materials, controlled tip collision, sputtering, or metal coating remain as the available preparation tools. Here, the goal was to prepare in situ a clean, crystallographic orientated tip without requiring the previous mentioned preparation methods.We used mechanical cleavage, a method that works with small crystallites as well as large single crystals to prepare clean tip surfaces. The orientation of preferential cleavage planes is difficult to predict, and several approaches exist that are applicable, depending upon the material. 8 These include the toughness tensor and the bond density concept. One of the simplest criteria to predict cleavage planes is the bond density concept: silicon and diamond, for example, cleave mainly along {111} planes because the number of bonds normal to the surface is minimized here. For cubic structures like NaCl and KBr, the toughness tensor approach has been shown to be very accurate. The toughness is smallest for the {100} planes and the corresponding cleavage planes show a {100} orientation. Cleavage can also be affected by defects in the material, either natural or artificial. The artificial defects can be positioned and prepared by diverse material processing techniques like laser treatment, dicing, or milling, depending on the material system.Nickel oxide was selected as the tip material. It is a cubic system, which crystallizes in rock salt structure and, by a) Electronic mail: thorsten.wutscher@physik.uni-regensburg.de. observation, cleaves preferentially along {100} cleavage planes. Thus three neighboring faces of a cube meet in one corner, that we propose to use as a SPM tip, ideally bounded by one atom with its [111] direction perpendicular to a sample surface. We explored two geometries, a two-sided cut rod and a single rod, as shown in Fig. 1.The preparation of each geometry started with a lapping process to form small plates of nickel oxide with a thickness between 80 and 450 μm. A wafer saw (Disco Systems Wafer Saw DAD320) equipped with a thin dicing blade ...