2001
DOI: 10.1063/1.1421645
|View full text |Cite
|
Sign up to set email alerts
|

Higher-order nonlinear dielectric microscopy

Abstract: Articles you may be interested inLateral resolution improvement in scanning nonlinear dielectric microscopy by measuring super-higher-order nonlinear dielectric constants

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
22
0

Year Published

2004
2004
2011
2011

Publication Types

Select...
5
2

Relationship

1
6

Authors

Journals

citations
Cited by 47 publications
(22 citation statements)
references
References 5 publications
0
22
0
Order By: Relevance
“…Even though the sign of the ͑4͒ signal never changed, the specimen was imaged because the signal level of ͑4͒ in the negative domain was smaller than that in the positive domain. We have previously observed this phenomenon in the measurement of a LiNbO 3 single crystal, 5 and consider the cause of this phenomenon to be as follows.…”
Section: Resultsmentioning
confidence: 97%
See 3 more Smart Citations
“…Even though the sign of the ͑4͒ signal never changed, the specimen was imaged because the signal level of ͑4͒ in the negative domain was smaller than that in the positive domain. We have previously observed this phenomenon in the measurement of a LiNbO 3 single crystal, 5 and consider the cause of this phenomenon to be as follows.…”
Section: Resultsmentioning
confidence: 97%
“…Thus, higher order nonlinear dielectric imaging has higher resolution and senses at a much shallower depth. 5 There are two types of SNDM, needle-type SNDM, which uses an electropolished tungsten needle as a tip for measuring a large area, and cantilever-type SNDM for measuring a small area with high resolution. In the case of cantilever-type SNDM, to keep in the contact state, we use a feedback circuit containing a laser and photodiode, analogous with contact-mode atomic force microscopy.…”
Section: Methodsmentioning
confidence: 99%
See 2 more Smart Citations
“…The scanning nonlinear dielectric microscopy approach employs a special resonator probe operating in the microwave frequency range. 51 Point-topoint detection of the local voltageinduced change in the sample capacitance allows nanoscale domain imaging in a surface layer of about 10-nm thick. Given that the width of domain walls in ferroelectrics is typically very small (of the order of 1-3 unit cells), this ferroelectric recording potentially allows extremely high data storage densities, well above that of conventional magnetic recording.…”
Section: High-density Data Storagementioning
confidence: 99%