Highlighting the impact of shear strain on the SiO2 glass structure: From experiments to atomistic simulations

Martinet, C.; Heili, Manon; Martinez, V.; Kermouche, Guillaume; Molnár, Gergely; Shcheblanov, N. S.; Tanguy, Anne

doi:10.1016/j.jnoncrysol.2020.119898

Cited by 19 publications

(18 citation statements)

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“…However, a slight variation of D2 band area was observed. This can be associated to a small difference in the plastic shear strain, probably affected by the surface substrate nature, which highly influences the proportion of the three-membered rings [67]- [68]- [69]. Considering the literature, the impact of shear deformation will be discussed further in the structural interpretation part of the silica film.…”

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confidence: 99%

Structural analysis of sputtered amorphous silica thin films: A Raman spectroscopy investigation

et al. 2021

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In this work, a structural characterization of sputtered silica films was carried out using Raman spectroscopy. Due to the low cross-section and the thinness of the silica layer, its Raman signature is dwarfed by that of the glass substrate and is therefore difficult to extract.Overcoming these limitations represents an experimental challenge and requires the development of specific analysis strategies. For this purpose, an integrated approach for extracting and interpreting the Raman signature of amorphous silica films deposited on a soda-lime glass substrate was developed, based on three distinct methods: delamination of the sputtered silica film, creating a reflective mask substrate by depositing a metallic silver coating on the glass substrate and applying a numerical signal analysis (Non-negative matrix factorization) to the multidimensional dataset acquired through depth profile acquisitions on silica films directly deposited on a glass substrate. The reliability of each proposed method is demonstrated for the extraction of the silica thin film Raman spectra. These various methods can be easily extended to other materials, either crystalline or amorphous. Furthermore, we discuss the advantages and the limits of each approach.Applying this methodology allowed us to highlight the structural differences between sputtered silica thin film and bulk vitreous silica glass (v-SiO2). Magnetron sputtering film deposition is shown to form dense silica glass layers, with an estimated densification ratio, 2 measured by x-ray reflectivity, equal to 7%. At the medium distance range, the network connectivity change in v-SiO2 is expressed by an unusually high population of three-membered rings leading to a more compact structure. The short-range order transformation was also studied by deriving the intertetrahedral angle decrease. The present results could be a step towards advanced investigation to gain insights into the structure of films at the atomic level.

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confidence: 99%

Structural analysis of sputtered amorphous silica thin films: A Raman spectroscopy investigation

et al. 2021

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“…Finally, the presence of defects in the permanent shear bands makes them visible with spectroscopic measurements, like Raman spectroscopy [21,135]. In the absence of permanent shear banding, the description of plasticity in terms of Eshelby inclusions, as well as the connection between heterogeneous elasticity and soft zones, should make it visible (see Figure 8) with high frequency acoustic scattering measurements [49] or using non-linear acoustics [136], thus making possible in the future the non-destructive identification and prediction of plasticity in amorphous materials.…”

Section: Perspectivesmentioning

confidence: 99%

“…In this context, numerical simulations at the atomic scale [7][8][9][10][11][12][13][14] combined with theories based on the existence of localized plastic rearrangements identified by their residual strains [15,16] have allowed building in the last thirty years a theoretical picture of plasticity in amorphous materials without referencing to structurally visible defects such as dislocations. The precise signature of plasticity is however strongly dependent on the composition of the glass, that is on the nature of the bonding (degree of covalency for example [6]), on the atomic composition [17,18], as well as on its thermo-mechanical history [19][20][21].…”

Section: Introductionmentioning

confidence: 99%

Elasto-plastic behavior of amorphous materials: a brief review

Tanguy¹

2021

Comptes Rendus. Physique

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Disordered materials, like metallic glasses or silicate glasses, have an atomistic amorphous structure preventing the formation of extended defects such as dislocations. Irreversible deformation in these materials is thus localized, but can organize along shear bands. In this brief review, based on recent publications, we will see if local plasticity can be measured and predicted in disordered atomic assemblies, and in what conditions it can be related to preexisting structural defects. We will then draw a general picture of the plastic mechanical behaviour within the theoretical framework of mechanical instabilities. Finally, we will focus our attention on different scenarii for shear banding in glasses.

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“…Sample 19 GPa I shows the greatest densification with 3.67% and a density of 2.597 g/cm 3 , within the series, while sample 19 GPa II shows lower densification at 3.15%/2.584 g/cm 3 . Higher densification of glass can occur due to the presence of shear stress as it can lead to a better folding of the glass network [30,31]. The increased densification value of 19 GPa I is ascribed to shear stress since the sample happened to be directly in contact with MgO without the NaCl pressure medium in between.…”

Section: Characterization Of Spectral Variationsmentioning

confidence: 99%

Utilizing Rare-Earth-Elements Luminescence and Vibrational-Spectroscopies to Follow High Pressure Densification of Soda–Lime Glass

et al. 2021

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A new series of soda–lime glass naturally doped with Nd and doped with 0.2 wt% of Eu2O3 was densified in a multi-anvil press up to 21 GPa. The densities of the millimetric samples were precisely measured using a floatation method in a heavy liquid made with sodium polytungstate. The obtained densification curve is significantly different from the calibration previously reported, reaching a maximum densification saturation of 3.55 ± 0.14%. This difference could be due to better hydrostatic conditions realized in this new study. The densified samples were characterized using Raman and Brillouin spectroscopy, as well as the emission of both Eu3+ and Nd3+. The evolution of the spectra was evaluated using integration methods to reduce error bars. The relative precision of the calibration curves is discussed. The evolution of Nd3+ transition was found to be the most sensitive calibration. Linear dependence with the density was found for all observables, with exception for Brillouin spectroscopy showing a divergent behavior. The Brillouin shift shows an unreported minimum for a densification ~0.4%.

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Highlighting the impact of shear strain on the SiO2 glass structure: From experiments to atomistic simulations

Cited by 19 publications

References 50 publications

Structural analysis of sputtered amorphous silica thin films: A Raman spectroscopy investigation

Structural analysis of sputtered amorphous silica thin films: A Raman spectroscopy investigation

Elasto-plastic behavior of amorphous materials: a brief review

Utilizing Rare-Earth-Elements Luminescence and Vibrational-Spectroscopies to Follow High Pressure Densification of Soda–Lime Glass

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