2015
DOI: 10.1111/jace.13988
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Highly Conductive p‐Type Zinc blende SiC Thin Films Fabricated on Silicon Substrates by Magnetron Sputtering

Abstract: Polycrystalline silicon carbide (SiC) thin films were fabricated on Si(100) substrates using radio-frequency magnetron sputtering followed by annealing at 1300°C in an Ar atmosphere. The SiC films exhibited a zinc blende structure with planar and point defects as detected by X-ray diffraction and Raman spectroscopy. The SiC films were p-type conductive with electrical resistivity as low as 2.8 3 10-3 ΩÁcm at room temperature. The p-type character of the SiC films can be explained in terms of the Si vacancies i… Show more

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Cited by 3 publications
(2 citation statements)
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“…In addition, the orientations of SiC indicated in the GIXRD spectrum agree with some studies in the literature [ 31 , 32 , 33 ]. We found that the peaks of the SiC matched well with those of α -SiC (6 H -SiC), however, it can be not excluded that β -SiC (3 C -SiC) exists.…”
Section: Resultssupporting
confidence: 89%
“…In addition, the orientations of SiC indicated in the GIXRD spectrum agree with some studies in the literature [ 31 , 32 , 33 ]. We found that the peaks of the SiC matched well with those of α -SiC (6 H -SiC), however, it can be not excluded that β -SiC (3 C -SiC) exists.…”
Section: Resultssupporting
confidence: 89%
“…In addition, the orientations of SiC indicated in GIXRD spectrum is in agreement with some studies in the literature [25][26][27]. We found that the peaks of the SiC matched well with those of α-SiC (6H-SiC), however, it can be not excluded that the existence of β-SiC (3C-SiC).…”
Section: Sic Thin Film Structuresupporting
confidence: 91%