“…Peaks corresponding to SiO 2 (PDF#27-0605) were detected in all samples because of the incomplete reduction from SiO 2 to PSi. [23] The Ni phyllosilicate precursor exhibited the strong diffraction peaks at 19.4°, 56.7°, 33.7°, 39.7°, 53.2°and 60.9°, which were originated from 2 : 1 Ni-PSi structure (PDF#43-0664), [25] though some of them overlapped with other diffractions. The Ni@PSi-400, 500, 600, 700 samples kept these diffractions well, but they became very vague over the Ni@PSi-850 catalyst.…”