Cuprous oxide (Cu 2 O) is known to show significant variation in its electrical properties. This article presents a correlation between local conductivity and preferential orientation of grains in polycrystalline Cu 2 O thin films. Out-of-plane current in the grain region and in-plane macroscopic conductivity are analysed and both show the same orientation dependence: The {111}-oriented interfaces are more conductive than in the {100} orientation. In conjunction with the columnar growth of the films, this shows that electrical properties of polycrystalline Cu 2 O thin films are dependent on the grain facet orientation.