Highly reliable A/D converter using analog voting

Namazi, Ali; Askari, Syed Sadique Anwer; Nourani, Mehrdad

doi:10.1109/iccd.2008.4751882

Cited by 9 publications

(2 citation statements)

References 16 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The redesign schemes mentioned in this work is not good enough to prevent systematic offset voltage (DC operating point) from failing. In our previous work [8], we proposed an analog voter using multiplexing scheme. We proposed two types of voting mechanism for increasing reliability of A/D converter.…”

Section: Prior Workmentioning

confidence: 99%

Scalable mean voter for fault-tolerant mixed-signal circuits

Askari

Dwivedi

Saeed

et al. 2010

2010 IEEE Aerospace Conference

View full text Add to dashboard Cite

Redundancy techniques, such as N-tuple modular redundancy has been widely used to improve the reliability of digital circuits. Unfortunately nothing substantial has been done for the analog and mixed signal systems. In this paper, we propose a redundancy based fault-tolerant methodology to design a highly reliable analog and digital circuits and systems. The key contribution of our work is an innovative mean voter. This mean voter is a low power, small area, very high bandwidth and linearly scalable voting circuit. Unlike other conventional voters which works with odd N in an NMR, the mean voter works for both odd and even N for analog units and hence reduces the area and power further. For the proof of concept, we designed two fault tolerant analog circuits i.e. a low pass anti-aliasing analog filter and a 4-bit flash ADC. We also presented fault-tolerance mechanism in 4-bit binary adder and an FPGA cell for demonstrating its advantage in digital applications. Experimental results are reported to verify the concepts and measure the system's reliability when single upset transient may occur.

show abstract

Section: Prior Workmentioning

confidence: 99%

Scalable mean voter for fault-tolerant mixed-signal circuits

Askari

Dwivedi

Saeed

et al. 2010

2010 IEEE Aerospace Conference

View full text Add to dashboard Cite

show abstract

“…These are majority, median or plurality [3]. At low redundancy factors (N < 7) the implementation of majority voter is more efficient [4]. The former research works are mainly based on the assumption that the voter is fault free [1], [2].…”

Section: Fault Tolerant Votermentioning

confidence: 99%

A Fault Tolerant Voter Circuit for Triple Modular Redundant System

Rahman¹

2017

JEEE

View full text Add to dashboard Cite

Abstract:Defect rate in Nanoelectronics is much higher than conventional CMOS circuits. Hardware redundancy can be a suitable solution for fault tolerance in nano level. A voter circuit is a part of a redundancy based fault tolerant system that enables a system to continue operating properly in the event of one or more faults within its components. Robustness of the voter circuit defines the reliability of the fault tolerant system. This paper provides simulation results and analysis of a fault tolerant voter circuit. In a Triple Modular Redundant (TMR) system, the robustness of the voter circuit has been improved. For this purpose, redundancy at transistor level has been added. In this technique each transistor of the various building blocks (Ex-OR gate, Multiplexer) of the voter circuit is replaced by a quadded-transistor structure. Quadded transistor structure provides built in immunity to all single defects as well as a large number of multiple defects. To evaluate the effectiveness of the voter circuit an IC layout in 90nm CMOS technology is developed. FPNI layout using qNAND hypercell is also designed and analysed. By simulation procedure it has been shown that the proposed fault tolerant voter circuit works properly as a majority voter in different faulty conditions of a TMR system. Moreover, it has been shown that in the presence of internal hardware failure (failure in transistor level) the voter circuit works properly.

show abstract

An on-chip sensor to measure and compensate static NBTI-induced degradation in analog circuits

Askari

Nourani

2013

Microelectronics Reliability

View full text Add to dashboard Cite

Highly reliable A/D converter using analog voting

Cited by 9 publications

References 16 publications

Scalable mean voter for fault-tolerant mixed-signal circuits

Scalable mean voter for fault-tolerant mixed-signal circuits

A Fault Tolerant Voter Circuit for Triple Modular Redundant System

An on-chip sensor to measure and compensate static NBTI-induced degradation in analog circuits

Contact Info

Product

Resources

About