2022
DOI: 10.3390/ma15124297
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Highly Robust Ti Adhesion Layer during Terminal Reaction in Micro-Bumps

Abstract: The use of scaled-down micro-bumps in miniaturized consumer electronic products has led to the easy realization of full intermetallic solder bumps owing to the completion of the wetting layer. However, the direct contact of the intermetallic compounds (IMCs) with the adhesion layer may pose serious reliability concerns. In this study, the terminal reaction of the Ti adhesion layer with Cu–Sn IMCs was investigated by aging the micro-bumps at 200 °C. Although all of the micro-bumps transformed into intermetallic… Show more

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Cited by 2 publications
(2 citation statements)
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“…Therefore, the strength of the joints could not be determined by the Sn–Cu 6 Sn 5 interface. Moreover, the previous studies revealed that the Cu/Cu 6 Sn 5 /Cu 3 Sn/Cu 6 Sn 5 /Cu structure had good strength [ 30 , 31 ], so the joint with Cu 6 Sn 5 that obtained in this experiment would not be fragile.…”
Section: Resultsmentioning
confidence: 74%
“…Therefore, the strength of the joints could not be determined by the Sn–Cu 6 Sn 5 interface. Moreover, the previous studies revealed that the Cu/Cu 6 Sn 5 /Cu 3 Sn/Cu 6 Sn 5 /Cu structure had good strength [ 30 , 31 ], so the joint with Cu 6 Sn 5 that obtained in this experiment would not be fragile.…”
Section: Resultsmentioning
confidence: 74%
“…Atomic interdiffusion occurs when Sn-based alloy is brought into contact with Cu, giving rise to the formation of intermetallic compounds (IMCs) such as Cu 6 Sn 5 and Cu 3 Sn at the contact interface [ 12 , 13 , 14 , 15 , 16 , 17 ]. The cooling conditions after the liquid/solid reaction had a significant effect on the thickness and morphology of IMCs [ 18 , 19 , 20 ].…”
Section: Introductionmentioning
confidence: 99%