2007
DOI: 10.1143/jjap.46.2344
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Highly Stable Thermal Characteristics of a Novel In0.3Ga0.7As0.99N0.01(Sb)/GaAs High-Electron-Mobility Transistor

Abstract: A novel In0.3Ga0.7As0.99N0.01(Sb)/GaAs high-electron-mobility transistor has been successfully investigated for the first time by incorporating surfactant Sb atoms during the InGaAsN channel growth by molecular beam epitaxy (MBE). Superior stable thermal characteristics, including a thermal threshold coefficient (∂Vth/∂T) of -0.807 mV/K and a high-temperature linearity (∂GVS/∂T) of -0.053 mV/K, were achieved because of the improved crystalline quality and the enhanced carrier confinement capability of the In0.… Show more

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Cited by 3 publications
(5 citation statements)
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“…Figure 5 shows the g m and I DSS characteristics with respect to the gate-to-source bias (V GS ) at elevated temperatures. The observed g m, max and peak I DSS values were found to be 161.5 (142) mS mm −1 and 230 (220) mA mm −1 respectively at 300 (450) K. The studied device also demonstrates improved current-driving capability (I DSS ) and maximum room-temperature extrinsic transconductance (g m, max ) as compared with other works [14,[20][21][22][23], as shown in table 2. Define the gate-voltage swing (GVS) value as the available gate bias range at a 10% drop from the g m, max value.…”
Section: Resultsmentioning
confidence: 56%
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“…Figure 5 shows the g m and I DSS characteristics with respect to the gate-to-source bias (V GS ) at elevated temperatures. The observed g m, max and peak I DSS values were found to be 161.5 (142) mS mm −1 and 230 (220) mA mm −1 respectively at 300 (450) K. The studied device also demonstrates improved current-driving capability (I DSS ) and maximum room-temperature extrinsic transconductance (g m, max ) as compared with other works [14,[20][21][22][23], as shown in table 2. Define the gate-voltage swing (GVS) value as the available gate bias range at a 10% drop from the g m, max value.…”
Section: Resultsmentioning
confidence: 56%
“…The studied device has also demonstrated improved thermal threshold stability as compared to other HFETs [14,[21][22][23], as also listed in table 2. Superior thermal threshold stability is mainly due to the improved channel confinement capability in the In 0.2 Ga 0.8 AsSb/GaAs QW structure with devised high discontinuity barriers.…”
Section: Resultsmentioning
confidence: 72%
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“…13,14 Thermal annealing was attempted in order to remove defects or nonradiative impurities and improve the luminescence efficiency. 15,16 In addition, HEMTs consisting of Sb-doped dilutechannel designs 17,18 were studied to demonstrate improved carrier transport and high-linearity gain characteristics, since doping Sb atoms can reduce the bandgap and smooth out the heterointerface at the same time.…”
mentioning
confidence: 99%