Highly textured silicon [111] crystalline thin-film on buffered soda-lime glass by e-beam evaporation

McMahon, Shane; Chaudhari, Ashok; Vispute, R. D.; Zhao, Zhizhong; Efstathiadis, Harry

doi:10.1016/j.matlet.2014.11.014

Cited by 4 publications

(2 citation statements)

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“…1 shows the XRD patterns for deposited thin film S1, S2 and S3. It is suggested that the sharp peak is coming from Si substrate, indicating the presence of (111) plane based on card file from JCPDS -International Centre for Diffraction Data [9]. However, there is no peak of Zn or Sb observed in the patterns.…”

Section: Methodsmentioning

confidence: 95%

Substrate temperature dependent surface morphology of nanostructured zinc antimonides thin films

Faudzi

Mukri

Ismail

et al. 2015

2015 10th Asian Control Conference (ASCC)

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The growth and characterization of nanostructured zinc antimonides thin films are reported in this work. The nanostructured zinc antimonides thin films were prepared by RF magnetron sputtering using a single sputtering target. The range of growth parameters was determined for substrate temperature (50 o C -150 o C), deposition time (600 s), argon flow rate (5 sccm) and RF power (50 W). The effects of manipulated growth parameters on surface morphology were investigated. XRD, EDX, FESEM and AFM were utilized to characterize the deposited thin films. Based on XRD characterization, Zn and Sb peaks are not captured in XRD patterns. The very low intensity of reflected peaks along 2Ө shows that the formation of deposited thin films is in amorphous form. From EDX characterization, it is confirmed that Zn and Sb elements existed in each deposited thin films. Zn seems to have relatively higher composition than Sb in each deposited thin films. It can be concluded that the growth parameters contributed to the deviation of the elementary composition. The AFM characterization shows the formation of nanograins and nanodots are depending on manipulated substrate temperature. As substrate temperature increased, it is found that the nanograins diameter is increased, low grain density and decreased in average roughness. It is confirmed that the height distribution of the nanograins and nanodots cause the surface to become rougher.

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Section: Methodsmentioning

confidence: 95%

Substrate temperature dependent surface morphology of nanostructured zinc antimonides thin films

Faudzi

Mukri

Ismail

et al. 2015

2015 10th Asian Control Conference (ASCC)

View full text Add to dashboard Cite

show abstract

“…One possibility that could provide the necessary cost reduction is the deposition of a high quality silicon crystalline thin film on glass followed by epitaxial single crystal growth of silicon or another semiconductor material, such as germanium, on the crystalline film [2,3]. If a semiconductor, such as silicon, crystalline thin film could be deposited onto glass with quality comparable to that found in the silicon single crystals used in the microelectronics industry, the cost of photovoltaic technology would drop significantly [3,4].…”

Section: Introductionmentioning

confidence: 99%