2004
DOI: 10.1002/adfm.200305156
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Hole Transport in Poly(phenylene vinylene)/Methanofullerene Bulk‐Heterojunction Solar Cells

Abstract: Hole transport in poly(phenylene vinylene)/methanofullerene bulk-heterojunction solar cells Melzer, C.; Koop, E.J.; Mihailetchi, V.D.; Blom, P.W.M.

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Cited by 394 publications
(320 citation statements)
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References 25 publications
(41 reference statements)
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“…The validity of our approach is further corroborated by the injection barrier values found in this procedure. The obtained hole injection barriers ͑ PEDOT ͒ agree well with literature values in the range of 0 -0.1 eV for the PEDOT:PSS/MDMO-PPV interface, 6,13 and 0.8-1 eV for the PEDOT:PSS/PCBM interface. 6,13,14 The low electron injection barriers ͑ Al and LiF/Al ͒ found for the interfaces with PCBM also agree well with earlier measurements.…”
supporting
confidence: 84%
“…The validity of our approach is further corroborated by the injection barrier values found in this procedure. The obtained hole injection barriers ͑ PEDOT ͒ agree well with literature values in the range of 0 -0.1 eV for the PEDOT:PSS/MDMO-PPV interface, 6,13 and 0.8-1 eV for the PEDOT:PSS/PCBM interface. 6,13,14 The low electron injection barriers ͑ Al and LiF/Al ͒ found for the interfaces with PCBM also agree well with earlier measurements.…”
supporting
confidence: 84%
“…In contrast, in MDMO-PPV:PCBM blends (weight ratio 1:4) the hole mobility in MDMO-PPV is increased up to 1Á4 Â 10 À4 cm 2 /Vs and the electron mobility in PCBM is 2 Â 10 À3 cm 2 /Vs. 21,22 Clearly, in MDMO-PPV: PCNEPV blends the electron and hole mobilities are significantly lower as compared to the values found in MDMO-PPV:PCBM blend. The low mobilities may affect the performance of the device.…”
Section: Charge Collection (H CC )mentioning
confidence: 81%
“…TAS is a well-established, effective technique for characterizing both shallow and deep defects, which has been broadly applied in understanding defects in thin film 27,28 and organic solar cells 29 . The energetic profile of trap density of states (tDOS) can be derived from the angular frequency dependent capacitance using the equation: 30…”
Section: Discussionmentioning
confidence: 99%