2021
DOI: 10.1038/s41598-021-89815-y
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Hot-carrier dynamics in InAs/AlAsSb multiple-quantum wells

Abstract: A type-II InAs/AlAs$$_{0.16}$$ 0.16 Sb$$_{0.84}$$ 0.84 multiple-quantum well sample is investigated for the photoexcited carrier dynamics as a function of excitation photon energy and lattice temperature. Time-resolved measurements are … Show more

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Cited by 14 publications
(10 citation statements)
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“…Fits to the transients best match a three-exponential decay with typical values of ≈1 ps for the fast decay, ≈30 ps for the intermediate decay, and ≈1 ns for the longer decay. Multi-exponential fits are limited in information, whereas converting the transient to its rate equation by relating the decaying signal strength to instantaneous excited carrier concentration n and differentiating it with respect to time gives . Figure d shows ∂ n ( t )/∂ t for the 43-nm smaller and 145-nm larger Cu 2 O nanospheres, along with insets of four common mechanisms for excited-state population decay (labeled as SRH, RR, AS, and TAS) that can be identified by the slope of any region in the rate equation. For both 43-nm smaller and 145-nm larger Cu 2 O nanospheres, the decay dynamics is dominated by Shockley–Reed–Hall (SRH) dynamics, where the excited-state population recombines with defects in the material and has a slope of m ≈ 1.…”
Section: Resultsmentioning
confidence: 99%
“…Fits to the transients best match a three-exponential decay with typical values of ≈1 ps for the fast decay, ≈30 ps for the intermediate decay, and ≈1 ns for the longer decay. Multi-exponential fits are limited in information, whereas converting the transient to its rate equation by relating the decaying signal strength to instantaneous excited carrier concentration n and differentiating it with respect to time gives . Figure d shows ∂ n ( t )/∂ t for the 43-nm smaller and 145-nm larger Cu 2 O nanospheres, along with insets of four common mechanisms for excited-state population decay (labeled as SRH, RR, AS, and TAS) that can be identified by the slope of any region in the rate equation. For both 43-nm smaller and 145-nm larger Cu 2 O nanospheres, the decay dynamics is dominated by Shockley–Reed–Hall (SRH) dynamics, where the excited-state population recombines with defects in the material and has a slope of m ≈ 1.…”
Section: Resultsmentioning
confidence: 99%
“…Similarly, the latter involves two photocarriers of the same species, where one recombines with a trap state and the resulting energy promotes the other deeper into its band through a free-carrier absorption process . Finally, a slope of m = 3 corresponds to AS, where a photoexcited electron–hole pair recombines, promoting a third photocarrier deeper into its band . The slope guides are used to highlight the dominant mechanism in various regions of the rate curves.…”
Section: Resultsmentioning
confidence: 99%
“…More comprehensive and systematic research on slowed carrier relaxation in Type-I InAs/AlAsSb had been conducted by Esmaielpour et al since 2016. 26,30,36,96 This shows a transition from hot carrier relaxation dominated by conventional phonon-mediated relaxation below 90 K to inhibited radiative recombination at elevated temperatures due to spatial separation of charge carriers, where the carrier relaxation rates were estimated based on the Q values calculated from CWPL and temperature-dependent PL. 96 The decoupling of phonon-mediated relaxation could result in PBE for hot carrier populations at higher temperature even with lower carrier density.…”
Section: Type II Qws and Slmentioning
confidence: 99%
“…The carrier relaxation rate was estimated based on the Q values, where slowed electron cooling rates were observed in both SQWs due to a higher steady‐state carrier densities and reduced Auger scattering. More comprehensive and systematic research on slowed carrier relaxation in Type‐ I InAs/AlAsSb had been conducted by Esmaielpour et al since 2016 26,30,36,96 . This shows a transition from hot carrier relaxation dominated by conventional phonon‐mediated relaxation below 90 K to inhibited radiative recombination at elevated temperatures due to spatial separation of charge carriers, where the carrier relaxation rates were estimated based on the Q values calculated from CWPL and temperature‐dependent PL 96 .…”
Section: Pbe Mechanisms In Low‐dimensional Semiconductorsmentioning
confidence: 99%