“…Recent measurements in SiGe agree roughly with our data, 16 but these authors apparently neglected the error in Ref. 1.…”
Section: Fig 3 Use Of Twosupporting
confidence: 90%
“…In the 1970s and early 1980s, several theoretical and experimental groups worked on the question of lowtemperature electron-phonon coupling in two-dimensional electron gases in silicon metal-oxide-semiconductor fieldeffect transistors ͑MOSFETs͒. [1][2][3][4][5][6] The work was motivated by the difference between the actual and theoretical mobilities of silicon MOSFETs and the possibility of making better devices. However, agreement was never reached on either the magnitude or the temperature dependence of the interaction.…”
mentioning
confidence: 99%
“…. Here R sq is the resistance per square of the sample, L is the length, n the electron number density, and L the Lorenz constant 1 3 (k B /e) 2 ϭ2.44 ϫ10 Ϫ8 W⍀/K 2 . T c is the electron temperature reached at the center of the sample.…”
We investigate electron-phonon coupling in a silicon metal-oxide-semiconductor field-effect transistor by measuring heat flow. Earlier studies of the electron-phonon interaction through similar measurements were complicated by electron diffusion, a competing cooling mechanism. We reduce the diffusion by using an unusually long sample, and account for the remainder by comparing results from two segments of different length. We find that the power dissipation from electron-phonon scattering is proportional to T 5 , with a magnitude smaller than theoretically predicted. ͓S0163-1829͑98͒04904-2͔
“…Recent measurements in SiGe agree roughly with our data, 16 but these authors apparently neglected the error in Ref. 1.…”
Section: Fig 3 Use Of Twosupporting
confidence: 90%
“…In the 1970s and early 1980s, several theoretical and experimental groups worked on the question of lowtemperature electron-phonon coupling in two-dimensional electron gases in silicon metal-oxide-semiconductor fieldeffect transistors ͑MOSFETs͒. [1][2][3][4][5][6] The work was motivated by the difference between the actual and theoretical mobilities of silicon MOSFETs and the possibility of making better devices. However, agreement was never reached on either the magnitude or the temperature dependence of the interaction.…”
mentioning
confidence: 99%
“…. Here R sq is the resistance per square of the sample, L is the length, n the electron number density, and L the Lorenz constant 1 3 (k B /e) 2 ϭ2.44 ϫ10 Ϫ8 W⍀/K 2 . T c is the electron temperature reached at the center of the sample.…”
We investigate electron-phonon coupling in a silicon metal-oxide-semiconductor field-effect transistor by measuring heat flow. Earlier studies of the electron-phonon interaction through similar measurements were complicated by electron diffusion, a competing cooling mechanism. We reduce the diffusion by using an unusually long sample, and account for the remainder by comparing results from two segments of different length. We find that the power dissipation from electron-phonon scattering is proportional to T 5 , with a magnitude smaller than theoretically predicted. ͓S0163-1829͑98͒04904-2͔
“…3.3). Now we discuss the results of works [147,148,149,150]. In [147] and [148], the electron scattering in Si inversion layers has been calculated in the high, T e = 200 ÷ 300 K, and low, T e = 1 ÷ 30 K, temperature ranges, respectively.…”
Section: Discussion Of Resultsmentioning
confidence: 99%
“…Interfaces always exist in real structures such as inversion layers, heterostructures, and quantum wells. (The only exceptions are [147,148,149,150]. All these treatments will be discussed later.…”
The article is devoted to modern problems of epilepsy, discusses the perspectives on the etiology, pathogenesis, definition, epidemiology, modern classification, discusses the diagnosis and prediction of disease and treatment strategy.
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