To decouple the trade-off relationship between short-circuit current I SC and open-circuit voltage V OC of thin-film silicon solar cells, which vary with texture morphology, it is necessary to first clarify the relationship between a solar cell's properties and its texture morphology. We have developed a method for quantitatively measuring the texture morphology, which has enabled us to identify novel indices on the basis of texture width and angle individually correlated to I SC and V OC . A texturing process based on these indices should allow I SC and V OC to be improved independently.