“…The resulting texture morphology was investigated by atomic force (AFM, Solver P47, NT-MDT, Moscow, Russia) and scanning electron (SEM, Hitachi S3400, Tokyo, Japan) microscopy, while optical properties were measured on a spectrophotometer with an integrating sphere (Cary 5000, Varian, Palo Alto, CA, USA) under normal incident conditions. While surface roughness (RMS) was directly available from AFM data, several key parameters were missing, which could have helped to achieve a trade-off between SC short-circuit current and open-circuit voltage that depends on the texture’s morphology, rather than simply on its RMS value [ 35 ]. Thus, for correlating morphology and optical properties, we used texture angle calculations derived from surface topography images, with calculation details being available elsewhere [ 36 ].…”