How do power supply voltage, pixel dwell time and test program duration affect the accuracy of Soft Defect Localization technique

Abstract

In our laboratory, Soft Defect Localization (SDL) technique without a synchronization signal is realized by Optical Beam Induced Resistance Change (OBIRCH). But the accuracy of this SDL technique depends on power supply voltage, pixel dwell time and test program duration. In this paper, we will present experimental results to show how to affect the accuracy of SDL technique by these three factors.