Although nanostructured
phase-change materials (PCMs) are considered
as the building blocks of next-generation phase-change memory and
other emerging optoelectronic applications, the kinetics of the crystallization,
the central property in switching, remains ambiguous in the high-temperature
regime. Therefore, we present here an innovative exploration of the
crystallization kinetics of Ge2Sb2Te5 (GST) nanoparticles (NPs) exploiting differential scanning calorimetry
with ultrafast heating up to 40 000 K sâ1. Our results
demonstrate that the non-Arrhenius thermal dependence of viscosity
at high temperature becomes an Arrhenius-like behavior when the glass
transition is approached, indicating a fragile-to-strong (FS) crossover
in the as-deposited amorphous GST NPs. The overall crystal growth
rate of the GST NPs is unraveled as well. This unique feature of the
FS crossover is favorable for memory applications as it is correlated
to improved data retention. Furthermore, we show that methane incorporation
during NP production enhances the stability of the amorphous NP phase
(and thereby data retention), while a comparable maximum crystal growth
rate is still observed. These results offer deep insight into the
crystallization kinetics of nanostructured GST, paving the way for
designing nonvolatile memories with PCM dimensions smaller than 20
nm.