“…Nonpolar GaN-based electronic devices, including high-electron-mobility transistors (HEMT), Schottky diodes, and metal–oxide–semiconductor field-effect transistor (MOSFET) sensors have been investigated to achieve enhanced performance such as enhancement mode (normally-off), temperature-stable characteristics with less pronounced hysteresis, and high sensitivity [ 3 , 4 , 5 , 6 ]. Due to the lack of native bulk GaN, researchers have been investigating the growth of a-plane GaN with improved structural properties grown on foreign substrates, using metal organic vapor phase epitaxy (MOCVD), molecular beam epitaxy (MBE), or hydride vapor phase epitaxy (HVPE) [ 7 , 8 , 9 , 10 ]. Among these methods, HVPE nonpolar a-plane GaN templates have attracted considerable attention for their high throughput and relatively good crystal quality, and in view of their efficient and effective commercial advantages [ 11 , 12 ].…”