2008 IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems 2008
DOI: 10.1109/comcas.2008.4562834
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Hybrid approach for RF MEMS devices

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Cited by 7 publications
(4 citation statements)
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“…The vast majority of RF MEMS switches today utilize thin-film metals as structural materials in order to decrease the RF loss of these devices. Devices that have attempted to utilize non-metallic structural materials [4], [5], [6], [7], [8] have not been successful due to poor RF performance and/or excessive process complexity that counteracts the advantages offered by single-crystal silicon.…”
Section: Introductionmentioning
confidence: 99%
“…The vast majority of RF MEMS switches today utilize thin-film metals as structural materials in order to decrease the RF loss of these devices. Devices that have attempted to utilize non-metallic structural materials [4], [5], [6], [7], [8] have not been successful due to poor RF performance and/or excessive process complexity that counteracts the advantages offered by single-crystal silicon.…”
Section: Introductionmentioning
confidence: 99%
“…The switch capacitance model [29], for a switch at up state, yields a capacitance C t of 6.6 fF between the CPW signal and ground lines for a ground capacitor area of 40 × 150 μm, a signal capacitor area of 20 × 40 μm, and an initial gap of 5 μm. According to the model, the calculated switch metal layer resistance is 0.3 Ω, and the calculated inductance is 0.1 nH.…”
Section: A Rf Modeling and Simulationmentioning
confidence: 99%
“…RF analytic modeling of the shunt ohmic switch included CPW impedance calculations using conformal mapping models [33], CPW metallic and dielectric loss models [33], and a multilayer parallel-plate capacitance model, including a fringing field model [29]. All these models were combined under a lumped circuit model of a shunt switch.…”
Section: A Rf Modeling and Simulationmentioning
confidence: 99%
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