Hybrid reciprocal lattice: application to layer stress determination in GaAlN/GaN(0001) systems with patterned substrates

Domagała, J.; Morelhão, Sérgio L.; Sarzynski, M.; Maździarz, Marcin; Dłużewski, Paweł; Leszczyński, M.

doi:10.1107/s1600576716004441

Cited by 13 publications

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“…Hybrid reflections (HRs) from multiple x-ray diffraction are known to cause extra features in diffraction data of thin films. In general, they can be easily avoided or identified by changing the sample azimuth [1], or they can be used as a tool for studying heteroexpitaxial films [3][4][5][6][7] and superlattices [8]. In a new class of epitaxial systems with potential applications in spintronic and quantum computation, film and substrate materials have quite different lattices [9][10][11][12].…”

mentioning

confidence: 99%

“…Measuring off-specular-rod HRs as a function of the incidence angle has been the most reliable procedure to evidence small amount of interface defects in epitaxial films, with accuracy better than the 0.05% limit of standard methods via asymmetric reflections [6]. Due to the very small mismatch of 0.04%, relaxation of thin Bi 2 Te 3 films on BaF 2 (111) is beyond the detectability limit of current methods.…”

mentioning

confidence: 99%

“…In-plane mismatch ∆a/a of Bi2Te3 and Bi2Te2.6 films on BaF2 (111), determined by measuring ∆θi [Eq (6)…”

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Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films

Morelhão

Kycia

Netzke

et al. 2018

Applied Physics Letters

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Epitaxial films of bismuth telluride topological insulators have received increasing attention due to potential applications in spintronic and quantum computation. One of the most important properties of epitaxial films is the presence of interface defects due to lateral lattice mismatch since electrically active defects can drastically compromise device performance. By describing hybrid reflections in hexagonal bismuth telluride films on cubic substrates, in-plane lattice mismatches were characterized with accuracy at least 20 times better than using other X-ray diffraction methods, providing clear evidence of 0.007% lateral lattice mismatch, consistent with stress relaxation associated with van der Waals gaps in the film structure.

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Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films

Morelhão

Kycia

Netzke

et al. 2018

Applied Physics Letters

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“…Fig. 1, bottom panel), which is also very useful for other diffraction techniques in semiconductor devices and single crystals in general (Domagała et al, 2016;Nisbet et al, 2015). Diffraction data from single crystals of d-alanine collected at two synchrotron facilities and with different instrumentation (flux, optics and goniometry) are presented.…”

Section: Physical Phase Measurements In X-ray Crystallographymentioning

confidence: 99%

“…on a sample xyz frame where z is along the azimuthal rotation axis (Domagała et al, 2016 (a) Difference Á in structure factor phases regarding the proposed models, as detailed in the inset (NH3 ! F G and N3e !…”

Section: Graphical Indexing Of Renninger Scansmentioning

confidence: 99%

X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological moleculesviaphysical phase measurements

et al. 2017

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1 This article will form part of a virtual special issue of the journal, presenting some highlights of the 13th Biennial Conference on HighResolution X-ray Diffraction and Imaging (XTOP2016).Keywords: invariant triplet phases; multiple diffraction; D-alanine crystals; zwitterions; synchrotron X-ray diffraction.X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements In this work, experimental and data analysis procedures were developed and applied for studying amino acid crystals by means of X-ray phase measurements. The results clearly demonstrated the sensitivity of invariant triplet phases to electronic charge distribution in d-alanine crystals, providing useful information for molecular dynamics studies of intermolecular forces. The feasibility of using phase measurements to investigate radiation damage mechanisms is also discussed on experimental and theoretical grounds.

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Dynamics of Defects in van der Waals Epitaxy of Bismuth Telluride Topological Insulators

et al. 2019

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Potential applications in spintronics and quantum information processing have motivated much recent research in epitaxial films of bismuth telluride. This system is also an example of van der Waals (vdW) epitaxy, where the interface coherence between the film and substrate is based on vdW bonds instead of strong ionic or covalent bonds. Because of the weakness of the vdW bonds, the overall quality of the epitaxial films is difficult to control and structural defects are easily introduced with a significant impact on the electronic phase diagram of the epitaxial films. To elucidate the evolution of defects as a function of the growth parameters, we combine nondestructive methods for electrical and structural analysis, as well as to establish intercorrelations between structural features and density of free charge carriers. It clearly shows that point defects and twinned domains favor p-type of charge carriers. Passivation of points defects by formation of metallic bismuth bilayers (BLs) drastically changes the whole film properties. By replacing vdW bonds with weak covalent bonds, the presence of BLs increases the film stiffness, leading to a smaller lattice misfit and a larger lateral lattice coherence length. Charge carriers are flipped to n-type. A few percent of BLs can be a strategy to achieve films with enhanced performance for device applications.

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Hybrid reciprocal lattice: application to layer stress determination in GaAlN/GaN(0001) systems with patterned substrates

Cited by 13 publications

References 36 publications

Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films

Hybrid reflections from multiple x-ray scattering in epitaxial bismuth telluride topological insulator films

X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological moleculesviaphysical phase measurements

Dynamics of Defects in van der Waals Epitaxy of Bismuth Telluride Topological Insulators

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