Abstract. We simulate electron transport in ultra small mercury-cadmium-telluride n + -n-n + diodes using a hydrodynamic approach. A numerical staggered solution is employed to treat the coupled hydrodynamic and Poisson equations, where the spatial profiles of the main transport parameters within the diodes are analyzed including the Auger generationrecombination processes. Our numerical results show that, even for low applied voltages, impact ionization processes are activated and affect dramatically the current-voltage characteristics of the Hg 0.8 Cd 0.2 Te diode.
IntroductionCarrier transport in advanced submicron devices is not always described with sufficient accuracy by the conventional drift-diffusion (DD) model. As a matter of fact, the DD model does not describe velocity overshoot, diffusion associated with carrier temperature gradients, or the dependence of impact ionization (II) rates on the carrier energy distributions. The limitations of the DD model indicate the need for more general transport models. Two of the more significant classes of such transport models are Monte Carlo (MC) and hydrodynamic (HD). The most accurate kinetic description is given by the MC method because it can take into account explicitly both the energy band-structure and the various scattering phenomena characteristics of the studied material. Therefore it enables a direct calculation of important transport quantities (distribution function, carrier density, drift velocity, mean energy, etc) but at a cost of long computation times and stochastic noise in the output data [1]. On the other hand, the results obtained from the MC simulations permit us also to calculate transport coefficients that can be used as input parameters for more simplified HD models. In this sense, the HD description of electron transport has been extensively applied to the analysis and design of semiconductor devices because it provides a useful compromise between computational simplicity and physical accuracy [2].In our previous work [3], we have demonstrated the robustness of the HD model to simulate the electronic transport in bulk HgCdTe (Mercury-Cadmium-Telluride, MCT) at 77 K. The majority of MCT-based devices contain a cadmium fraction x = 0.2 which allows, at 77 K, the detection in the 8-14 !m spectral region and which is thus a widely used alloy for infrared optoelectronics applications. The consequence of this alloy proportion is a narrow semiconductor band-gap of about 0.1 eV: in particular, degeneracy and impact ionization processes are activated from low electric fields of the order of 100 V/cm [4]. Despite of his wide interest, few results are available in the literature concerning a physical modelling of transport in MCT-based devices. In this paper, we present the simulation of one-dimensional Hg 0.8 Cd 0.2 Te n