2022
DOI: 10.1016/j.tsf.2022.139474
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Hydrogen effects at sputtered Tb-doped AlNxOy:H / c-Si(p) interfaces: A transient surface photovoltage spectroscopy study

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Cited by 2 publications
(1 citation statement)
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“…To investigate the conduction mechanism in AlB10 and facilitate the development of filmbased devices with an Al-AlB10-nSi structure, the current-voltage characteristics (I-V curves) were examined [10][11][12][13][14][15][16][17][18][19][20][21][22][23][24][25].…”
Section: The Methodology and Experimental Resultsmentioning
confidence: 99%
“…To investigate the conduction mechanism in AlB10 and facilitate the development of filmbased devices with an Al-AlB10-nSi structure, the current-voltage characteristics (I-V curves) were examined [10][11][12][13][14][15][16][17][18][19][20][21][22][23][24][25].…”
Section: The Methodology and Experimental Resultsmentioning
confidence: 99%