“…In this respect, a substantial part of the research activities of Prof. Jean-Claude Dousse was directed to an accurate determination of different atomic FPs using reflection-type or transmission-type high energyresolution crystal-based spectrometers 27,60 and standalone laboratory-based X-ray sources, synchrotron radiation, or charged particles for the excitation of the X-ray emission processes to be studied. Examples of this work include the study of linewidths of X-ray emission processes, 28 radiative Auger transitions, 24 Xray resonant Raman scattering, 59 CK factors, 9,10 hypersatellite X-ray transitions, 26,42 two-electron one-photon transitions, 29 atomic level widths, 21 and off-resonant X-ray spectroscopy. 7 In this work, an independent investigation of the CK factors of the Gd L shell using two different detection schemes, a radiometrically calibrated silicon drift detector (SDD) and a full cylinder von Hamos spectrometer, is reported as a further illustration of the valuable contributions of wavelengthdispersive spectrometry to an accurate determination of atomic FPs.…”