“…Although these results indicate that the formation of hysteresis-causing traps at the semiconductor/gate dielectric interface is strongly responsible for the observed hysteresis, the presence ͑in the dielectric bulk͒ of chemical species that cause slow polarization ͑e.g., polar functionalities, ionic impurities, and diffused water molecules͒ is also an important cause for the hysteresis observed in the OFETs. [23][24][25][26][27][28][29][30] When a polymer is used as the gate dielectric in an OFET, the end functionalities present both at the polymer surface and in the bulk have an important influence on the device performance ͑e.g., drain current, mobility, threshold voltage, and hysteresis͒. 7,31-33 Although polar functionalities, such as hydroxyl groups, are known to seriously affect the hysteresis observed during the operation of polymer-dielectric-based OFETs, 17,18,[22][23][24][25]28,29 there are only a few research papers that discuss in detail how each constituent of the polymer gate dielectric contributes to the origin and mechanism of the hysteresis.…”