2012
DOI: 10.1103/physrevlett.109.245501
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Ab initioCalculations of Deep-Level Carrier Nonradiative Recombination Rates in Bulk Semiconductors

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Cited by 94 publications
(53 citation statements)
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“…The choice or parameters leads to a converged vibrational spectrum of the × × 4 4 4 defect supercell. A similar procedure to construct the dynamical matrix was recently used for defects in GaN by Shi and Wang [60]. Partial HR factors are then determined from equations (5) and (7).…”
Section: Appendix B Calculations For Very Large Supercellsmentioning
confidence: 99%
“…The choice or parameters leads to a converged vibrational spectrum of the × × 4 4 4 defect supercell. A similar procedure to construct the dynamical matrix was recently used for defects in GaN by Shi and Wang [60]. Partial HR factors are then determined from equations (5) and (7).…”
Section: Appendix B Calculations For Very Large Supercellsmentioning
confidence: 99%
“…This is a donor with very deep levels and is expected to have a low formation energy in Zn-doped GaN. 25 However, the authors calculated the holecapture coefficient C pS to be only 5.6 × 10 −10 cm 3 s −1 , a value too small to explain the high efficiency of the nonradiative recombination in this material.…”
Section: A Parameters Of the Modelmentioning
confidence: 99%
“…The concentration of free electrons in region Ia can now be obtained from Eq. (10) with N + S = N S for p type as n ≈ G C nS N S (25) and with N + S = N A − N D for n type as…”
Section: A Low Excitation Intensitymentioning
confidence: 99%
“…In general, if the defect level is close to the conduction band minimum (CBM), electrons can be more easily trapped, but it will be very difficult to trap holes. Similarly, holes can be easily trapped and electron trapping is difficult when the defect level is close to the valance band maximum (VBM) 6 . Consequently, the recombination process is determined by the slower trapping rate of the electron or hole.…”
mentioning
confidence: 99%