1999
DOI: 10.1103/physrevb.60.8158
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Ab Initiostudy of the mixed dimer formation in Ge growth on Si(100)

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Cited by 17 publications
(20 citation statements)
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References 26 publications
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“…Our calculated barrier is slightly lower than that reported in Ref. 15 with a different xc functional and a less precise localization of the saddle point ͑E a = 1.4 versus 1.6 eV͒. As already noticed, this mechanism a͒ Present address: Department of Chemistry, Princeton University, Princeton, New Jersey 08544-1009. cannot contribute to intermixing at 330 K since its reaction rate is as low as ϳ 10 8 s −1 , as obtained from the Arrhenius relation = 0 exp͓−E a / ͑k B T͔͒, where 0 is set to the usual value of 10 THz.…”
contrasting
confidence: 42%
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“…Our calculated barrier is slightly lower than that reported in Ref. 15 with a different xc functional and a less precise localization of the saddle point ͑E a = 1.4 versus 1.6 eV͒. As already noticed, this mechanism a͒ Present address: Department of Chemistry, Princeton University, Princeton, New Jersey 08544-1009. cannot contribute to intermixing at 330 K since its reaction rate is as low as ϳ 10 8 s −1 , as obtained from the Arrhenius relation = 0 exp͓−E a / ͑k B T͔͒, where 0 is set to the usual value of 10 THz.…”
contrasting
confidence: 42%
“…High-resolution photoemission data showed the formation of mixed SiGe dimers by depositing Ge on Si͑001͒ at 623 K, 13 while scanning tunneling microscopy measurements 14 revealed the formation of GeSi mixed dimers down to 330 K. Elementary processes leading to Si/ Ge intermixing have been theoretically investigated within density functional theory ͑DFT͒ as well. [15][16][17][18] An activation energy of 1.6 eV was calculated for a Si/ Ge exchange between the first and the second surface layer, 16 while exchanges between adatoms and surface atoms are predicted to have barriers of 1.6 eV ͓for Ge adatom on Si͑001͔͒ 15 or 1.5 eV ͓for Si adatom on Ge͑001͔͒. 16 Starting from a stable ad-dimer, intermixing with surface atoms would occur with calculated activation energies of 1.2 eV for a SiGe turning into a SiSi or 1.4 eV for the reverse mechanism.…”
mentioning
confidence: 99%
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“…In this paper, we discuss how such simulations are performed, including elementary events such as deposition, as well as adatom and ad-dimer diffusion and taking into account the known anisotropy produced by the reconstruction of the Si (100) surface [4]. Importantly, studies [5][6][7] have also indicated that there is intermixing in the layers adjacent to the interface so that the Si-Ge interface. We have also included two inter-mixing mechanisms to account for this.…”
Section: Introductionmentioning
confidence: 99%
“…6,17,[21][22][23][24][25] It is now established experimentally and theoretically that Ge can mix with the surface dimers at room temperature, and that deep intermixing to the third and fourth atomic layers occurs at temperatures of 773 K and higher. Calculations also showed kinetic paths for Si/Ge exchange at the (105) surface.…”
Section: 4mentioning
confidence: 99%