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            , pulse response testing: A unified approach to testing digital and analogue ICs

Beasley, J.; Ramamurthy, Hema; Ramírez-Angulo, J.; DeYong, M.

doi:10.1049/el:19931405

Cited by 23 publications

(1 citation statement)

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“…In particular, the most likely faults (usually catastrophic) are anticipated based on a fault model, and a set of input stimuli and measurements are selected to detect faults. The measurements may be dc responses [51], ac responses at circuit outputs [52]- [55], ac responses at the power supply node [56], transient responses at circuit outputs [57], [58], or transient responses at the power supply node [59]. Then for the set of potential faults, the circuit's response for each stimulus is evaluated for each fault with all but the faulty parameter set to nominal values, i.e., the parameters for which the circuit was designed.…”

Section: A Simulation-before-testmentioning

confidence: 99%

A tutorial introduction to research on analog and mixed-signal circuit testing

Milor

1998

IEEE Trans. Circuits Syst. II

224

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Traditionally, work on analog testing has focused on diagnosing faults in board designs. Recently, with increasing levels of integration, not just diagnosing faults, but distinguishing between faulty and good circuits has become a problem. Analog blocks embedded in digital systems may not easily be separately testable. Consequently, many papers have been recently written proposing techniques to reduce the burden of testing analog and mixed-signal circuits. This survey attempts to outline some of this recent work, ranging from tools for simulation-based test set development and optimization to built-in self-test (BIST) circuitry.

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